3D Memory Stack Bonding Layout for High Integration and Stress Balance

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Solution Overview

Problem

Current memory devices face challenges in achieving high integration and reduced planar area while maintaining efficient connectivity and stress balance, which affects their performance and reliability.

Innovation Solution

The memory device is designed with two structures coupled together, featuring a first structure with a peripheral circuit and a second structure with a memory cell array, where conductive patterns are recessed into the substrate to reduce height and stress, and the substrate wiring structure connects components, allowing for flexible design and reduced warpage.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If memory devices are highly integrated with increased degree of integration, then performance and capacity improve, but planar area and device complexity increase

Engineering Contradiction:
Improveintegration degreeVSAvoidplanar area
Core Design Contradiction:
ProductivityVSArea of stationary object

Solution Approach 1:

The patent transitions from planar 2D layout to 3D vertical stacking by forming memory holes and channel structures that extend through multiple insulating layers. Word lines, bit lines, and select lines are arranged in vertical stacks, enabling high integration without increasing planar footprint.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

Multiple functional layers are nested within each other vertically: insulating layers contain conductive patterns, which contain channel structures, which are surrounded by gate structures. This nested arrangement packs maximum functionality into minimal planar space.

Inventive Principle:
Principle #7Nested doll (Nesting)

2Area of stationary object

If conductive patterns are recessed into substrate to reduce height, then planar area and stress balance improve, but manufacturing complexity increases

Engineering Contradiction:
Improveplanar areaVSAvoidstructure complexity
Core Design Contradiction:
Area of stationary objectVSDevice complexity

Solution Approach 1:

The conductive patterns are divided into multiple segments: some remain on the substrate surface while others are recessed into the substrate at different depths. This segmentation allows optimization of each region's function and stress distribution.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different regions of the conductive patterns have different properties: surface patterns provide electrical connectivity while recessed patterns reduce height and balance stress. The insulating layers are also selectively positioned to provide local stress management and electrical isolation.

Inventive Principle:
Principle #3Local quality

3Ease of operation

If bonding pads are positioned to connect peripheral circuit to memory cell array, then connectivity and functionality improve, but device complexity and area increase

Engineering Contradiction:
ImproveconnectivityVSAvoidstructure complexity
Core Design Contradiction:
Ease of operationVSDevice complexity

Solution Approach 1:

The bonding pads serve multiple functions: they provide electrical connectivity between peripheral circuits and memory cell arrays, act as stress distribution elements, and enable modular device assembly. This multi-functionality reduces the need for separate dedicated structures.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS11967574B2Memory device and data storage system including the same
Publication Date: 2024.04.23 SAMSUNG ELECTRONICS CO LTD
  • US11967574B2 patent drawing
  • US11967574B2 patent drawing
  • US11967574B2 patent drawing

AI summary

A memory device including a first structure; and a second structure on the first structure, wherein the first structure includes a first substrate; a peripheral circuit on the first substrate; a first insulating layer covering the first substrate and the peripheral circuit; and a first bonding pad on the first insulating layer, the second structure includes a second substrate; a memory cell array on a first surface of the second substrate; a second insulating layer covering the first surface of the second substrate and the memory cell array; a conductive pattern at least partially recessed from a second surface of the second substrate; and a second bonding pad on the second insulating layer, the first bonding pad is in contact with the second bonding pad, and the conductive pattern is spaced apart from the second insulating layer.