Memory System Short Super Block Bad Block Management
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Solution Overview
Problem
Memory systems face inefficiencies in managing run-time bad blocks, leading to wasted memory space and altered erase/write cycles when forming super blocks, as existing methods either waste normal blocks or disrupt the balance of erase/write cycles during re-mapping operations.
Innovation Solution
A memory system that designates a short super block based on a bit-map representing normal and bad blocks, allowing for simultaneous access and operation on only normal blocks within the short super block, thereby avoiding re-mapping and maintaining balanced erase/write cycles.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If a super block is formed including run-time bad blocks, then memory space utilization is improved, but the erase/write cycles become unbalanced and normal blocks are wasted
Solution Approach 1:
The invention segments the super block into two distinct types: short super blocks containing only normal blocks (with at most one bad block) and long super blocks containing multiple bad blocks. This segmentation allows the system to differentiate between memory regions that can be safely accessed simultaneously versus those requiring special handling, thereby maintaining erase/write cycle balance while maximizing memory space utilization.
Solution Approach 2:
The invention applies local quality by treating different regions of the memory device differently based on their characteristics. Short super blocks with predominantly normal blocks are handled with standard simultaneous access operations, while long super blocks with multiple bad blocks are managed separately. This localized differentiation preserves the erase/write cycle balance for normal blocks without compromising overall memory space utilization.
2Reliability
If re-mapping operations are performed to handle bad blocks, then bad block access is prevented, but normal blocks are wasted and erase/write cycles are altered
Solution Approach 1:
The invention extracts and isolates bad blocks from the normal block structure by forming separate long super blocks containing only bad blocks. This extraction prevents bad blocks from being mistakenly accessed during normal operations while preserving normal blocks in short super blocks for continued use, thereby eliminating normal block waste that would otherwise occur during re-mapping operations.
Solution Approach 2:
The invention converts the harmful presence of bad blocks into a beneficial classification system. By identifying super blocks with at most one bad block as short super blocks, the system can safely perform simultaneous access operations on these blocks without requiring re-mapping. This transforms the potential harm of bad blocks into a useful distinction that enables efficient memory management while preventing normal block waste.
3Speed
If simultaneous access is performed on all blocks in a super block, then access speed is improved, but bad blocks disrupt the operation
Solution Approach 1:
The invention segments super blocks into short super blocks (with at most one bad block) and long super blocks (with multiple bad blocks). This segmentation enables the system to perform simultaneous access operations on short super blocks containing normal blocks while excluding long super blocks from such operations. The segmentation thus maintains high access speed for valid blocks while preventing operational disruptions from bad blocks.
Solution Approach 2:
The invention applies local quality by enabling simultaneous access only for specific local regions (short super blocks with normal blocks) while excluding regions with multiple bad blocks. This localized approach maintains high access speed for the majority of functional blocks without allowing bad blocks to disrupt overall system operation, thereby balancing speed and reliability.
Data Source
AI summary
A memory system includes: a memory device; a run-time bad block detector suitable for storing information of super memory blocks, each including a run-time bad block, in a bad list; a bit-map manager suitable for generating a bit-map representing integrity information of memory blocks in each of the super memory blocks; a short super block manager suitable for designating, among the super memory blocks, a super memory block having a number of run-time bad blocks less than or equal to a threshold as a short super memory block based on the bad list and the bit-map, whenever a logical unit configuration command is received from a host; and a processor suitable for controlling the memory device to simultaneously access normal blocks among the memory blocks forming the designated short super memory block and to perform a normal operation, based on the bit-map.