Memory Device Temperature Control Using Historical Data

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Solution Overview

Problem

Semiconductor memory devices face instability due to the delay between temperature sensing and control, leading to inaccuracies in temperature-based operational adjustments.

Innovation Solution

A method and device that include a temperature sensor, control logic circuit, and register to sense, process, and store temperature data, allowing for the calculation of an estimated temperature using past data to calibrate and improve control accuracy, reducing the impact of extraction delay time.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If temperature sensing is performed continuously, then temperature control accuracy is improved, but device complexity increases

Engineering Contradiction:
Improvetemperature control accuracyVSAvoiddevice complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The system performs preliminary temperature sensing and stores multiple past temperature values in a register before control decisions are made. This allows the control logic to calculate estimated current temperature using historical data, reducing the need for continuous real-time sensing while maintaining accuracy.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent introduces an intermediary calculation process where the control logic circuit computes the estimated current temperature by combining multiple past temperature values. This intermediary step bridges the gap between discrete temperature samples and continuous temperature control requirements.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Loss of time

If temperature extraction delay is reduced, then real-time control is improved, but measurement precision deteriorates

Engineering Contradiction:
Improveextraction delay timeVSAvoidtemperature measurement accuracy
Core Design Contradiction:
Loss of timeVSMeasurement precision

Solution Approach 1:

The system implements feedback by continuously storing temperature values in a register and using the control logic to calculate estimated current temperature based on historical data. This feedback mechanism compensates for extraction delay by predicting current temperature from past measurements, maintaining both real-time responsiveness and measurement precision.

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

Multiple past temperature values are preliminarily stored in the register before control decisions are made. This preliminary accumulation of temperature data allows the system to compensate for extraction delay through calculation, achieving both fast response and high precision.

Inventive Principle:
Principle #10Preliminary action

3Measurement precision

If multiple temperature samples are stored, then temperature control accuracy is improved, but loss of time increases

Engineering Contradiction:
Improvetemperature control accuracyVSAvoiddata processing time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The system uses a partial approach by storing a limited number of past temperature values (e.g., 4-8 samples) rather than all historical data. This partial storage provides sufficient accuracy for temperature control while minimizing data processing time and memory requirements.

Inventive Principle:
Principle #16Partial or excessive action

Data Source

PatentUS10446217B2Memory device and control method thereof
Publication Date: 2019.10.15 SAMSUNG ELECTRONICS CO LTD
  • US10446217B2 patent drawing
  • US10446217B2 patent drawing
  • US10446217B2 patent drawing

AI summary

A method of controlling a memory device including a temperature sensor includes sensing a temperature of the memory device and extracting an extracted temperature for controlling the memory device using the sensed temperature, storing the extracted temperature in the memory device, calculating an estimated temperature at a current time point using the extracted temperature and a plurality of past extracted temperatures stored in the memory device, and controlling the memory device using the estimated temperature.