Memory Temperature Range Management to Reduce Refresh Overhead

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Many memory systems perform unnecessary refresh operations due to operating outside a defined safe temperature range, leading to reduced performance, increased latency, and decreased device lifetime.

Innovation Solution

Implementing cross-temperature range management by defining an expected temperature range and determining a safe operating range, reducing unnecessary refresh operations and optimizing performance and reliability.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If the memory system performs refresh operations to ensure data reliability outside the safe temperature range, then data reliability is maintained, but performance decreases and latency increases

Engineering Contradiction:
Improvedata reliabilityVSAvoidperformance
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent changes the parameter of temperature range definition by introducing an expected temperature range parameter that is broader than the safe temperature range. This allows the system to operate with reduced refresh operations in the extended temperature range while maintaining acceptable reliability, thus resolving the contradiction between reliability and performance.

Inventive Principle:
Principle #35Parameter changes

2Reliability

If the memory system performs frequent refresh operations to maintain data integrity, then data reliability is improved, but device lifetime decreases

Engineering Contradiction:
Improvedata integrityVSAvoiddevice lifetime
Core Design Contradiction:
ReliabilityVSDuration of action of stationary object

Solution Approach 1:

The patent modifies the temperature range parameter to define an expected temperature range that extends beyond the safe temperature range. This parameter change enables the system to reduce refresh operation frequency in the extended range, thereby extending device lifetime while maintaining data integrity through alternative reliability mechanisms.

Inventive Principle:
Principle #35Parameter changes

3Reliability

If the memory system operates within a narrow safe temperature range, then data reliability is maintained, but adaptability to different operating environments decreases

Engineering Contradiction:
Improvedata reliabilityVSAvoidtemperature range adaptability
Core Design Contradiction:
ReliabilityVSAdaptability or versatility

Solution Approach 1:

The patent introduces a new parameter called expected temperature range that is broader than the safe temperature range. This allows the memory system to adapt to different operating environments (including extreme temperatures) while maintaining data reliability through the combined use of this parameter and enhanced reliability mechanisms such as error correction codes.

Inventive Principle:
Principle #35Parameter changes

4Adaptability or versatility

If the memory system uses enhanced reliability mechanisms in extended temperature ranges, then adaptability is improved, but device complexity increases

Engineering Contradiction:
Improvetemperature range adaptabilityVSAvoidmanagement complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent segments the temperature range into distinct zones: safe temperature range and expected temperature range. This segmentation allows the system to apply different management strategies and reliability mechanisms to different temperature zones, reducing overall complexity by avoiding the need for enhanced mechanisms across the entire range.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS20260037151A1Cross-temperature range management in memory systems
Publication Date: 2026.02.05 MICRON TECHNOLOGY INC
  • US20260037151A1 patent drawing
  • US20260037151A1 patent drawing
  • US20260037151A1 patent drawing

AI summary

Methods, systems, and devices for cross-temperature range management in memory systems are described. One or more parameter values defining an expected temperature range may be indicated to and stored at a memory system, where the memory system may define a safe temperature range and one or more additional temperature ranges using the one or more parameter values. After entering the safe temperature range, the memory system may refresh one or more memory cells of one or more memory devices for which write operations were performed outside of the safe temperature range. By defining safe temperatures for operation using an expected operating range, the memory system may reduce a quantity and frequency of refresh operations and may increase a performance and quality of service (QOS), while reducing latency in operations and communications. Further, endurance and device lifetime may be increased by reducing a quantity of refresh operations.