Semiconductor Memory Test Device Dynamic Address Protocol Selection
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Solution Overview
Problem
Conventional semiconductor memory test devices face challenges in adjusting memory configurations and accurately addressing failed cells due to fixed address protocols, leading to incorrect assignment of fail addresses and complex, costly reprogramming when switching between different memory configurations like x2, x4, x8, etc.
Innovation Solution
A semiconductor memory test device with a mode selecting unit to choose the appropriate memory address protocol based on active test modes and an address arranging unit to map logical addresses accordingly, allowing for flexible configuration adjustments and accurate fail address identification across different memory configurations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a fixed memory address protocol is used in conventional test devices, then the device structure is simple, but the device cannot adapt to different memory configurations (x2, x4, x8, etc.) and produces incorrect fail addresses
Solution Approach 1:
The patent implements dynamic address protocol selection by introducing a mode selecting unit that chooses between different memory address protocols (x2, x4, x8, etc.) based on the active test mode. The address arranging unit dynamically maps logical addresses to physical addresses according to the selected protocol, enabling the test device to adapt to different memory configurations rather than using a fixed protocol.
Solution Approach 2:
The patent changes the address mapping parameters based on the selected test mode. The address arranging unit adjusts the logical-to-physical address mapping relationship according to different memory configurations (x2, x4, x8, etc.), allowing the same hardware to correctly test various memory organizations by changing address interpretation parameters rather than physical structure.
2Adaptability or versatility
If the memory configuration is changed in conventional test devices, then different testing requirements are met, but reprogramming becomes complex and costly
Solution Approach 1:
The patent creates a universal test device that can handle multiple memory configurations (x2, x4, x8, etc.) through a single hardware platform. The mode selecting unit and address arranging unit work together to provide multi-functional capability, eliminating the need for separate test devices or complex reprogramming for different configurations.
Solution Approach 2:
The address arranging unit acts as an intermediary between the logical address space and physical address space. It translates and adapts address signals according to the selected memory configuration, serving as a mediator that simplifies the interface between the fixed test hardware and variable memory configurations, thereby reducing reprogramming complexity.
3Measurement precision
If logical addresses are not properly mapped to physical addresses in different configurations, then the address system remains simple, but fail address identification becomes incorrect
Solution Approach 1:
The address arranging unit performs preliminary address arrangement before the actual memory testing occurs. By pre-mapping logical addresses to physical addresses according to the selected configuration, the system ensures accurate fail address identification from the outset, rather than attempting to correct address mapping issues during or after testing.
Data Source
AI summary
A semiconductor memory test device and method thereof are provided. The example semiconductor memory test device may include a fail memory configured to store at least one test result of a memory under test, a mode selecting unit configured to output a selection signal for selecting a memory address protocol of the fail memory based upon which one of a plurality of test modes is active in the memory under test and an address arranging unit configured to arrange address signals to conform with the selected memory address protocol in response to the selection signal received from the mode selecting unit.