Memory Test Program Generation via Component Library

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Solution Overview

Problem

Conventional memory test encoding programs have low efficiency and are prone to coding errors due to their fixed timing specifications and test contents, making them inadequate for special test requirements and conditions.

Innovation Solution

A method and device for generating a test program that acquires configuration information and test logic, determines and combines test program components from a preset library, and configures them with parameters to create a customized test program that meets specific memory test requirements and conditions, avoiding coding errors and improving efficiency.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If a standard memory test encoding program is used, then the testing process is simple and fast, but the test coverage is limited and cannot meet special test requirements

Engineering Contradiction:

Improvetest program generation efficiencyVSAvoidtest requirement adaptability

Core Design Contradiction:

ProductivityVSAdaptability or versatility

Solution Approach 1:

The test program is segmented into multiple independent test program components, each representing a specific test function or operation. These components can be selectively combined to create customized test programs that meet different test requirements, resolving the contradiction between efficiency and adaptability.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The test program generation system dynamically selects and combines test program components based on specific test requirements and conditions. This dynamic approach allows the same component library to serve multiple test scenarios, improving both efficiency and adaptability.

Inventive Principle:

Principle #15Dynamics

2Reliability

If test programs are coded manually for special test requirements, then the test coverage is comprehensive, but coding errors are likely to occur and development time increases

Engineering Contradiction:

Improvetest program accuracyVSAvoidprogram coding time

Core Design Contradiction:

ReliabilityVSLoss of time

Solution Approach 1:

Standard test program components are pre-configured with correct syntax and parameters according to memory language rules. This preliminary preparation eliminates the need for manual coding of routine test sequences, reducing coding errors and development time while maintaining comprehensive test coverage.

Inventive Principle:

Principle #10Preliminary action

Solution Approach 2:

Instead of manually coding test programs from scratch, the system copies and combines pre-verified test program components to create customized test programs. This copying approach ensures consistency and accuracy while significantly reducing coding time.

Inventive Principle:

Principle #26Copying

3Device complexity

If fixed timing specifications are used in standard test programs, then the program structure is simple, but the test precision for special conditions is insufficient

Engineering Contradiction:

Improveprogram structure complexityVSAvoidtest timing precision

Core Design Contradiction:

Device complexityVSMeasurement precision

Solution Approach 1:

Different test program components have different timing specifications optimized for their specific functions. When combining components, the system applies local timing adjustments to meet precise test requirements while maintaining overall program structure simplicity.

Inventive Principle:

Principle #3Local quality

Data Source

PatentUS11960751B2Test program generation method, device, memory medium and electronic equipment

Publication Date: 2024.04.16 CHANGXIN MEMORY TECH INC

AI summary

A test program generation method, a test program generation device, a computer readable storage medium, and an electronic equipment are disclosed. The test program generation method includes: acquiring a configuration information of the memory and a test logic for the memory; determining at least one type of test program components from a preset test program component library according to the test logic; and acquiring a test program according to the configuration information by combining a plurality of test program components. Types of the plurality of test program components are included in the determined at least one type of test program components. The test program generation method not only meets different test requirements and matches different test conditions, but also avoids coding errors and improve the efficiency and accuracy in generating a memory test program.