Memory System Test Region Position Adjustment

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Solution Overview

Problem

Existing memory systems lack an effective method to detect error positions during test operations, which can lead to incomplete error detection and correction, especially when the pattern data region changes within the test region.

Innovation Solution

A memory system with a test region that includes a processor capable of writing and reading pattern data, using tag data to determine the position of the pattern data region and adjust it, allowing for thorough error detection and correction by comparing transmitted and read pattern data.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If the pattern data region position is fixed in the test region, then the test operation is simple, but error detection is incomplete when the pattern data region changes

Engineering Contradiction:
Improveerror detection capabilityVSAvoidtest operation complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The pattern data region position is made adjustable within the test region rather than fixed. The processor can write pattern data to different positions in the test region, and the host device can adjust the position of the pattern data region to perform comprehensive error detection across the entire memory device.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

Tag data is introduced as an intermediary to mark the position information of the pattern data region. The tag data contains location information that indicates where the pattern data is written in the test region, enabling the host device to accurately identify and adjust the pattern data region position for error detection.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Measurement precision

If tag data with location information is used to determine pattern data region position, then error detection accuracy is improved, but data transmission volume increases

Engineering Contradiction:
Improveerror position detection accuracyVSAvoiddata transmission volume
Core Design Contradiction:
Measurement precisionVSQuantity of substance

Solution Approach 1:

The data structure is segmented into distinct components: tag data containing location information and pattern data. The tag data is positioned at the beginning of the test region and contains only the necessary position information, while the pattern data follows. This segmentation allows efficient processing and reduces redundant data transmission.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The tag data with location information is prepared and written to the test region before the pattern data is written. This preliminary action establishes the position markers in advance, allowing the host device to quickly identify the pattern data region without needing to process or analyze the entire data set.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS11101017B2Memory system and test system
Publication Date: 2021.08.24 SK HYNIX INC
  • US11101017B2 patent drawing
  • US11101017B2 patent drawing
  • US11101017B2 patent drawing

AI summary

A memory system includes a memory device including a test region; and a processor configured to write pattern data transferred from a host device to a pattern data region included in the test region, read test data from the test region, and transmit the read test data to the host device. A position of the pattern data region may be adjustable in the test region.