Memory Test Signal Generation Using Serial-to-Parallel Commands
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Solution Overview
Problem
Existing semiconductor devices and test apparatuses face challenges in reducing power consumption during high-frequency signal generation and increasing manufacturing costs, while requiring flexible design capabilities for testing memory components.
Innovation Solution
A semiconductor device with a command distributor that converts serial commands into parallel commands using a first clock signal, a command decoder that generates pattern sequences based on these parallel commands, and a signal generator that produces operating signals synchronized with a second clock signal of higher frequency, along with a test apparatus that includes these components to efficiently test devices under test (DUTs).
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If high frequency signals are generated for testing memory components, then testing speed and productivity are improved, but power consumption increases
Solution Approach 1:
The test apparatus is divided into multiple independent test channels, each capable of operating at different clock frequencies. This segmentation allows high-frequency operation for critical paths while maintaining lower frequencies for other channels, thereby reducing overall power consumption while maintaining testing productivity.
Solution Approach 2:
The system dynamically adjusts the clock frequency of each test channel based on the specific testing requirements. The clock generator can vary frequencies across different channels and during different test phases, enabling high-speed testing when necessary while consuming less power during routine operations.
2Ease of manufacture
If test apparatus is designed with fixed architecture, then manufacturing cost is reduced, but flexibility in testing different memory components is limited
Solution Approach 1:
The test apparatus employs a universal command distributor that can interpret and distribute various types of test commands across multiple channels. This multi-functional design allows a single apparatus to test different memory component types and configurations without requiring custom-designed test equipment for each case, thus maintaining manufacturing economy while achieving testing flexibility.
Solution Approach 2:
The system uses dynamically reconfigurable clock frequency allocation where each test channel can be independently configured to operate at optimal frequencies for different memory types. This dynamic configuration capability provides versatility in testing various memory components while maintaining a standardized, cost-effective hardware architecture.
3Device complexity
If serial commands are used for control, then device complexity is reduced, but command processing speed and productivity decrease
Solution Approach 1:
The command distribution system segments the command processing function across multiple parallel channels. While commands are received in serial form, the command distributor simultaneously distributes them to multiple test channels that operate in parallel, effectively increasing command processing throughput without requiring complex parallel command interfaces.
Solution Approach 2:
The system dynamically converts serial commands into parallel execution operations. The command distributor and clock generator work together to take serial input commands and generate synchronized parallel test operations across multiple channels, achieving high processing speed while maintaining simple serial command interface architecture.
Data Source
AI summary
A semiconductor device and a test apparatus including the same, the semiconductor device including a command distributor receiving a serial command that is synchronized with a first clock signal and converting the serial command into a parallel command, a command decoder receiving the parallel command and generating a pattern sequence based on the parallel command, and a signal generator receiving the pattern sequence and generating operating signals synchronized with a second clock signal, wherein a frequency of the first clock signal is less than a frequency of the second clock signal.