Automated Memory Testing via Variable Reference Voltage

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Solution Overview

Problem

Memory testing requires significant manpower to manually adjust voltages and run testing programs, limiting efficiency and scalability.

Innovation Solution

A memory testing system comprising a processor, power supply, and memory devices, where the processor controls the power supply to vary reference voltages across multiple levels, automatically testing memory devices under different voltage conditions.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If manual voltage adjustment and testing program execution are used, then testing flexibility is maintained, but productivity is reduced due to significant manpower requirements

Engineering Contradiction:

Improvetesting efficiencyVSAvoidmanual intervention requirement

Core Design Contradiction:

ProductivityVSEase of operation

Solution Approach 1:

The testing system performs voltage adjustment and testing program execution automatically without requiring staff to be on-site. The power supply unit autonomously ramps voltages and the system automatically executes different testing programs, making the system self-sufficient and eliminating manual operation requirements.

Inventive Principle:

Principle #25Self-service

Solution Approach 2:

The patent replaces manual mechanical operations (staff physically adjusting voltage controls and running programs) with an automated electronic control system. The power supply unit and processor automatically perform voltage ramping and testing program execution, substituting human mechanical actions with electronic automation.

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

2Productivity

If automated voltage control is implemented, then productivity increases through simultaneous testing, but device complexity increases due to additional control components

Engineering Contradiction:

Improvesimultaneous testing capabilityVSAvoidcontrol system structure

Core Design Contradiction:

ProductivityVSDevice complexity

Solution Approach 1:

The power supply unit serves multiple functions: it provides power to memory devices under test and simultaneously acts as a voltage control mechanism for ramping voltages during testing. This multi-functionality allows automated testing without requiring separate dedicated voltage control equipment, thereby managing complexity while enabling simultaneous testing of multiple devices.

Inventive Principle:

Principle #6Universality (Multi-functionality)

3Measurement precision

If multiple voltage levels are tested, then measurement precision improves for voltage threshold detection, but loss of time increases due to extended testing duration

Engineering Contradiction:

Improvevoltage threshold accuracyVSAvoidtesting duration

Core Design Contradiction:

Measurement precisionVSLoss of time

Solution Approach 1:

The power supply unit continuously ramps voltages without interruption during testing, maintaining continuous useful action. This continuous voltage ramping allows the system to efficiently determine voltage thresholds by observing when memory devices fail during the ongoing voltage increase, thereby achieving precise measurements without requiring multiple separate testing cycles that would extend total testing time.

Inventive Principle:

Principle #20Continuity of useful action

Data Source

PatentUS20250131974A1Memory testing system and memory testing method

Publication Date: 2025.04.24 NAN YA TECH

AI summary

The present disclosure provides a memory testing system, including at least one memory device, a power supply, and a processor. The power supply is configured to provide a first reference voltage to the at least one memory device according to a control signal. The processor is configured to provide the control signal to control the power supply to vary the first reference voltage among multiple voltage levels and test the at least one memory device under the voltage levels to generate multiple first testing results corresponding to the voltage levels.