Memory Sub-System Thermal Sensor Failure Detection
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional memory sub-systems fail to detect thermal sensor failures effectively, which can lead to undetected extreme temperatures causing memory device malfunctions and potential damage, especially in critical systems like autonomous vehicles.
Innovation Solution
A memory sub-system that designates specific memory cells to detect thermal sensor failures by programming them to threshold voltages between valid states and comparing these values to pre-programmed patterns representing extreme temperatures, allowing the system to determine if the thermal sensor is functioning correctly without additional hardware.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If thermal sensors are added to monitor temperature in memory devices, then temperature monitoring capability is improved, but device complexity and cost increase
Solution Approach 1:
The memory device uses its own internal memory cells to perform temperature monitoring and thermal sensor failure detection. The system programs specific memory cells to threshold voltages between valid states, then reads these cells to determine temperature conditions and sensor health without requiring external monitoring hardware. This self-service approach eliminates the need for additional thermal sensors while maintaining reliable temperature monitoring capability.
2Reliability
If redundant thermal sensors are added to detect sensor failures, then detection reliability is improved, but device complexity and cost increase
Solution Approach 1:
The system uses the existing memory cells and read operations to detect thermal sensor failures. By programming memory cells to specific threshold voltages and comparing read values against pre-programmed patterns, the system can determine thermal sensor health status without requiring redundant sensors. This approach provides reliable failure detection while avoiding the complexity of additional sensor hardware.
Solution Approach 2:
The system creates a virtual copy of temperature monitoring functionality using memory cells that replicate the monitoring function. Instead of adding physical redundant sensors, the system uses memory cells programmed with threshold voltages to create an informational copy that detects sensor failures by comparing current readings against stored reference patterns.
3Measurement precision
If additional hardware is added to monitor thermal sensor health, then detection accuracy is improved, but manufacturing cost increases
Solution Approach 1:
The memory device performs thermal sensor health monitoring using its existing resources - memory cells and read operations. The system programs specific cells to threshold voltages between valid states, then uses standard read operations to detect temperature conditions and sensor failures. This self-service approach achieves accurate detection without requiring additional hardware components, thereby avoiding increased manufacturing costs.
Data Source
AI summary
Respective values of a subset of the plurality of memory cells of a memory device are compared to a pattern of pre-programmed memory cells. The pattern pre-programmed memory cells comprise representations of values of the pattern of pre-programmed memory cells when a temperature criterion is satisfied. Responsive to determining that at least a threshold number of the respective values of the subset matches the pattern of pre-programmed memory cells, a temperature reading from a thermal sensor coupled to the memory device is identified. Responsive to determining that the temperature reading does not correspond to a temperature criterion, determining that the thermal sensor has failed.