Memory Sub-System Thermal Throttling Using Data Reliability

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Solution Overview

Problem

Memory sub-systems face performance degradation and potential failure due to excessive temperature fluctuations, with existing thermal throttling methods reducing performance even when temperature is brought within safe ranges.

Innovation Solution

Implementing a memory sub-system temperature throttling component that analyzes data reliability parameters, such as raw bit error rate, to determine if thermal throttling operations are necessary, thereby delaying or avoiding throttling when parameters are within acceptable ranges.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Temperature

If thermal throttling operations are performed to reduce temperature, then temperature is reduced to safe ranges, but performance is reduced during the throttling period

Engineering Contradiction:
Improvememory sub-system temperatureVSAvoidmemory sub-system performance
Core Design Contradiction:
TemperatureVSProductivity

Solution Approach 1:

The patent changes the decision parameter for thermal throttling from temperature alone to a combination of temperature and data reliability parameters (RBER). By introducing RBER as an additional parameter, the system can make more informed decisions about when to throttle, avoiding unnecessary performance reduction while still protecting against thermal damage when truly needed.

Inventive Principle:
Principle #35Parameter changes

2Productivity

If thermal throttling operations are avoided to maintain performance, then performance is maintained, but temperature may exceed safe operating ranges

Engineering Contradiction:
Improvememory sub-system performanceVSAvoidmemory sub-system temperature
Core Design Contradiction:
ProductivityVSTemperature

Solution Approach 1:

The patent implements a feedback mechanism that continuously monitors both temperature and data reliability parameters (RBER). This dual-parameter feedback system allows the controller to make dynamic decisions about thermal throttling, ensuring that performance is maintained when conditions permit while preventing thermal damage when necessary. The feedback loop enables real-time adjustment of throttling decisions based on actual system state.

Inventive Principle:
Principle #23Feedback

3Device complexity

If thermal throttling is performed based solely on temperature thresholds, then temperature control is simple, but unnecessary throttling occurs when performance could be maintained

Engineering Contradiction:
Improvethermal control mechanismVSAvoidmemory sub-system performance
Core Design Contradiction:
Device complexityVSProductivity

Solution Approach 1:

The patent performs preliminary assessment of data reliability parameters (RBER) before initiating thermal throttling. By evaluating RBER in advance, the system can determine whether the memory components are operating in a state where they can tolerate higher temperatures without compromising data integrity. This preliminary action prevents unnecessary throttling and maintains performance when conditions allow.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS11635794B2Memory sub-system temperature throttling relaxation
Publication Date: 2023.04.25 MICRON TECHNOLOGY INC
  • US11635794B2 patent drawing
  • US11635794B2 patent drawing
  • US11635794B2 patent drawing

AI summary

A method includes monitoring temperature characteristics for a plurality of memory components of a memory sub-system and determining that a temperature characteristic corresponding to at least one of the memory components has reached a threshold temperature. The method further includes determining a data reliability parameter for the at least one of the memory components that has reached the threshold temperature, determining whether the determined data reliability parameter is below a threshold data reliability parameter value for the at least one of the memory components that has reached the threshold temperature, and, based on determining that the data reliability parameter for the at least one of the memory components that has reached the threshold temperature is below the threshold data reliability parameter value, refraining from performing a thermal throttling operation.