Memory Device Timing Self-Diagnosis for High-Speed Interface Reliability
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing memory systems face challenges in managing timing violations during high-speed data transmission, leading to potential defects in products before manufacturing, as existing technologies do not effectively monitor and correct timing violations in memory devices.
Innovation Solution
A memory system with a host and memory device that includes an access parameter timer, spec register, comparison circuit, and mode register to measure, compare, and store timing violations, allowing for real-time monitoring and correction of timing deviations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If timing monitoring and correction mechanisms are implemented in memory devices, then reliability of high-speed interface is improved, but device complexity increases
Solution Approach 1:
The memory device performs self-diagnosis by automatically monitoring its own command timing parameters against specification values and storing violation information in internal mode registers, eliminating the need for external testing equipment during operation
Solution Approach 2:
The comparison circuit continuously compares actual timing values with specification values and feeds back violation information to the mode register, enabling real-time timing correction and ensuring reliable high-speed interface operation
2Reliability
If timing violation detection is performed during normal operation, then manufacturing defects are prevented, but measurement precision requirements increase
Solution Approach 1:
The patent replaces complex external timing measurement equipment with an integrated access parameter timer and comparison circuit that directly measure and evaluate timing parameters within the memory device, simplifying the measurement system while maintaining precision
Data Source
AI summary
In some embodiments, a memory system includes a memory device and a host configured to transmit, to the memory device, a command and address (C/A) signal and a clock signal, and to transmit or receive data signals to or from the memory device. Each command that is configured to access the memory device is associated with an access timing parameter. The memory device includes an access parameter timer configured to measure an actual timing value of the access timing parameter, a spec register configured to provide a spec timing value defining an effective timing of the access timing parameter, a comparison circuit configured to compare the actual timing value and the spec timing value, and a mode register configured to store an access timing violation flag that is read by the host when the actual timing value deviates from the spec timing value by exceeding a predetermined range.