Memory Device Verify Voltage Timing Adjustment
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Solution Overview
Problem
As integration density of memory devices increases, interference between memory cells and metal lines grows, affecting the reliability of verify operations during program operations in three-dimensionally structured memory blocks.
Innovation Solution
A memory device with a peripheral circuit that adjusts the time point for applying a verify voltage to a selected word line based on the order of program operations, using a control logic circuit to transmit operation codes for adjusting the timing of verify voltage output.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If integration density of memory devices is increased, then storage capacity is improved, but interference between memory cells and metal lines increases
Solution Approach 1:
The patent applies dynamics by making the verify operation timing adjustable rather than fixed. The peripheral circuit changes the time point at which verify voltage is applied based on the program operation order, allowing the system to adapt to interference conditions in densely integrated memory structures.
Solution Approach 2:
The patent changes the timing parameter of the verify operation. By adjusting when the verify voltage is applied relative to the program operation sequence, the system optimizes performance in high-density configurations where interference is present.
2Reliability
If verify operation timing is adjusted according to program operation order, then reliability of verify operation is improved, but device complexity increases
Solution Approach 1:
The peripheral circuit performs preliminary adjustment of the verify operation timing based on the known program operation order. By pre-configuring the timing according to the operation sequence, the system achieves reliable verify operations without requiring complex real-time adjustments during execution.
Data Source
AI summary
A memory device, and a method of operating the memory device, includes a memory block in which a plurality of cell pages are coupled to each of word lines. The memory device also includes a peripheral circuit configured to adjust a time point at which a verify voltage is applied to a selected word line among the word lines according to an order of performing a program operation during a verify operation of a selected cell page. The memory device further includes a control logic circuit configured to transmit, to the peripheral circuit, an operation code for adjusting a time point at which the verify voltage is output.


