Memory Supply Voltage Monitoring With ADC-Based Fault Detection
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Solution Overview
Problem
Memory devices face data errors due to unmonitored analog signals going out of range, exceeding the error correction capability, leading to performance degradation and potential system failures.
Innovation Solution
A memory device with a built-in analog signals monitoring system, including a power management circuit with a voltage supply, internal reference voltage, multiplexer, analog-to-digital converter, and digital comparator, which converts and compares signal values to detect deviations from predetermined ranges, setting an error flag for fault conditions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If analog signals are not monitored, then the memory device can complete operations without additional monitoring circuitry, but data errors occur when analog signals go out of range
Solution Approach 1:
The patent combines the analog-to-digital converter (ADC) and digital comparator into an integrated monitoring circuit that is merged with the existing power management circuitry. This integration allows analog signal monitoring to be performed within the existing device structure, adding reliability through error detection while minimizing the increase in overall device complexity through component consolidation.
Solution Approach 2:
The patent introduces an analog-to-digital converter (ADC) as an intermediary component that bridges the analog domain (where supply voltages and signals exist) and the digital domain (where comparison and error detection occur). This intermediary enables the digital comparator to evaluate analog signals by converting them to digital values, thereby detecting out-of-range conditions without requiring direct analog processing in the digital logic.
2Reliability
If analog signals are monitored continuously, then data errors can be detected early, but power consumption increases
Solution Approach 1:
The patent implements periodic monitoring of analog signals rather than continuous monitoring. The ADC and digital comparator are activated at specific intervals or at critical transition points (such as during voltage switching operations), allowing the system to detect errors while minimizing the time the monitoring circuitry is active, thereby reducing overall power consumption while maintaining adequate error detection capability.
3Reliability
If multiple supply voltages are monitored, then comprehensive error detection is achieved, but the monitoring circuit becomes more complex
Solution Approach 1:
The patent designs the monitoring circuit with universal functionality to handle multiple supply voltages (e.g., VDD, VDDQ, VPP) through a single integrated ADC and digital comparator structure. The multiplexer selectively routes different supply voltage signals to the ADC, allowing the same monitoring circuitry to evaluate multiple voltages sequentially, thereby achieving comprehensive monitoring coverage without proportionally increasing circuit complexity.
4Measurement precision
If analog signals are converted to digital values for comparison, then precise threshold evaluation is possible, but processing time increases
Solution Approach 1:
The patent performs preliminary conversion of analog supply voltage signals to digital values using the ADC before the actual memory access operations commence. By preparing the digital representations of the analog signals in advance, the system can quickly compare these pre-converted values against threshold ranges during operation without incurring conversion delays at critical moments, thereby reducing the impact on overall processing time while maintaining measurement precision.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution enables early detection and prevention of data errors, reducing processing delays, computational complexity, and power consumption by initiating error recovery operations, thereby enhancing system performance and reliability.
Implementation Method 1
an analog-to-digital converter (ADC) configured to convert the internal reference voltage and a scaled version of the selected supply voltage into one or more digital values
Data Source
AI summary
A method of operating a memory device includes: supplying one or more supply voltages to a memory array; and monitoring the one or more supply voltages, which includes: selecting, from the one or more supply voltages, a selected supply voltage; converting, using an analog-to-digital converter (ADC), an internal reference voltage of the memory device and a scaled version of the selected supply voltage into one or more digital values; generating a calibrated measurement result using the one or more digital values; and determining whether the calibrated measurement result is within a pre-determined range.