Memory Reading Voltage Adjustment via Iterative Halving

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Solution Overview

Problem

Semiconductor memory devices require precise reading voltages, and existing methods lack efficiency in adjusting these voltages to ensure accurate reading, as they often fail to quickly locate the optimal 'turn on' window for each memory type.

Innovation Solution

A reading method that updates the voltage by moving a predetermined distance, either increasing or decreasing it, until it falls within the 'turn on' window, with the distance being halved each iteration to expedite the process, and potentially changing the distance pattern over multiple attempts.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a fixed reading voltage is provided without adjustment, then the reading operation is simple, but the reading accuracy deteriorates when the voltage is not within the turn on window

Engineering Contradiction:
Improvereading accuracyVSAvoidvoltage adjustment complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent dynamically adjusts the reading voltage parameter by comparing it against the turn on window boundaries. When the reading voltage falls outside the window, the system automatically modifies the voltage parameter to bring it within the acceptable range, ensuring accurate reading operations without manual intervention.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent implements a feedback mechanism where the reading voltage is continuously monitored and compared against the turn on window. Based on this comparison feedback, the system determines whether adjustment is needed and executes相应的 voltage modification to maintain optimal reading conditions.

Inventive Principle:
Principle #23Feedback

2Measurement precision

If the reading voltage is manually adjusted to locate the turn on window, then the reading accuracy improves, but the time and complexity of voltage adjustment increases

Engineering Contradiction:
Improvereading accuracyVSAvoidvoltage adjustment time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent enables the reading voltage adjustment process to be self-service by automatically comparing the current reading voltage against the turn on window boundaries and performing necessary adjustments without requiring manual intervention. This self-adjusting mechanism significantly reduces the time and effort needed to achieve accurate reading voltage settings.

Inventive Principle:
Principle #25Self-service

3Speed

If the reading voltage is adjusted by a large fixed amount, then the convergence to turn on window is faster, but the precision of locating the optimal voltage decreases

Engineering Contradiction:
Improvevoltage adjustment speedVSAvoidvoltage localization precision
Core Design Contradiction:
SpeedVSMeasurement precision

Solution Approach 1:

The patent employs a dynamic adjustment approach where the voltage modification amount is not fixed but adapts based on the distance to the turn on window. The system adjusts the reading voltage iteratively, modifying it by calculated amounts that respond to the current state, thereby achieving both rapid convergence and precise localization of the optimal reading voltage.

Inventive Principle:
Principle #15Dynamics

Data Source

PatentUS9053758B2Reading method of memory
Publication Date: 2015.06.09 MACRONIX INTERNATIONAL CO LTD
  • US9053758B2 patent drawing
  • US9053758B2 patent drawing
  • US9053758B2 patent drawing

AI summary

A reading method of a memory is provided. The memory has a turn on window. The reading method comprises the following steps. A reading voltage is provided. The reading voltage is shown if the reading voltage is located in the turn on window. The reading voltage is updated by moving a predetermined distance if the reading voltage is not located in the turn on window. The predetermined distance is cut by half before the step of updating the reading voltage is performed again.