Memory Operating Voltage Adjustment Using Boot-Time Self-Test
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Solution Overview
Problem
Memory devices with high-capacity storage face increased power consumption due to fixed operating voltages determined by adding various margins during manufacturing, often using more power than necessary for operation.
Innovation Solution
A semiconductor system that dynamically adjusts operating voltage by performing self-tests at each boot cycle to determine the minimum required voltage, using a power management integrated circuit and self-test circuits to optimize power consumption.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If fixed operating voltage with margins is used during manufacturing testing, then reliability is ensured, but power consumption increases unnecessarily
Solution Approach 1:
The patent implements dynamic voltage adjustment by allowing the operating voltage to be modified after manufacturing based on actual device performance. The voltage is initially set with margins during manufacturing, then subsequently adjusted downward through self-test procedures that determine the minimum required voltage, transforming the static voltage into a dynamic parameter that adapts to actual needs.
Solution Approach 2:
The patent changes the voltage parameter from a fixed value determined during manufacturing to a variable that can be adjusted post-manufacturing. By implementing self-test circuits that measure actual operating requirements and modify the voltage accordingly, the system transforms the voltage parameter to optimize power consumption while maintaining reliability.
2Use of energy by moving object
If self-test circuit is added to determine minimum operating voltage, then power consumption is reduced, but device complexity increases
Solution Approach 1:
The patent merges the self-test functionality with existing manufacturing test infrastructure. The self-test circuit uses the same test patterns and measurement approaches already employed during manufacturing, combining quality assurance functions with voltage determination functions to minimize additional complexity.
Solution Approach 2:
The system performs self-testing and self-determination of minimum operating voltage using integrated circuits within the device itself. The memory device autonomously executes self-test patterns and determines its own voltage requirements, eliminating the need for external testing equipment and reducing overall system complexity.
Data Source
AI summary
A semiconductor system that includes a core die including a memory cell; a host die electrically connected to the core die; and a power management integrated circuit that provides an operating voltage to the core die. The host die includes a self-test circuit that performs a self-test on the memory cell at one or more voltage levels according to a test pattern and outputs a self-test result based on the self-test, in response to receiving a boot signal; and a processor that determines a minimum operating voltage of the core die based on the self-test result.