Built-in Memory Chip Voltage Analysis for Abnormal Detection
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Solution Overview
Problem
The existing methods for diagnosing and troubleshooting abnormal hardware in computers, particularly with the BIOS system, are labor-intensive and inefficient, requiring manual switching of components like built-in memory, which consumes significant time and resources.
Innovation Solution
A test method that utilizes a test device coupled to the debug port of a motherboard to execute a test function within the BIOS, which creates a data file analyzing memory chip voltages and identifies abnormal chips, allowing for targeted replacement without desoldering the entire memory module.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If manual switching of hardware components is used for testing, then comprehensive hardware testing can be performed, but labor cost and time consumption increase significantly
Solution Approach 1:
The system performs self-diagnosis through automated testing. The testing device automatically identifies abnormal memory chips by analyzing voltage data and comparing it with reference values, eliminating the need for manual component switching and significantly reducing labor costs and testing time while maintaining comprehensive testing coverage
Solution Approach 2:
The patent replaces manual mechanical operations (physically switching hardware components) with an automated electronic testing system. The testing device uses electrical signals and data analysis to identify faulty memory chips, substituting the mechanical process of manual component replacement with an automated electronic diagnostic process
2Reliability
If entire memory modules are replaced instead of individual chips, then hardware reliability is restored, but manufacturing complexity and cost increase
Solution Approach 1:
The patent segments the memory module into individual memory chips for targeted replacement. By identifying and replacing only the specific abnormal chip rather than the entire memory module, the system reduces repair complexity and cost while maintaining memory system reliability. The testing device provides precise location information for faulty chips, enabling selective replacement
Solution Approach 2:
The patent applies local quality by treating each memory chip individually with different diagnostic and replacement decisions. Instead of uniformly replacing entire memory modules, the system identifies specific chips with abnormal voltage characteristics and targets only those for replacement, optimizing resource utilization and reducing unnecessary repairs
3Measurement precision
If detailed voltage analysis of each memory chip is performed, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The testing device incorporates multi-functionality by integrating voltage measurement, data analysis, comparison with reference values, and abnormal chip identification into a single unified system. This universal approach achieves precise measurement of each memory chip's voltage characteristics without requiring separate complex devices for each function, thereby maintaining measurement precision while controlling overall device complexity
Data Source
AI summary
A test method for testing a built-in memory in a computer device includes the following operations. The built-in memory is tested by a test function of a basic input/output system (BIOS) in the computer device to create a data file. An analysis application is performed by a test device to analyze the data file. According to analyzing the data file, an abnormal memory chip is determined whether to exist in the built-in memory. The data file includes test data of memory chips in the built-in memory.