Solid State Memory Wear Estimation via Completion Time
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Solution Overview
Problem
Current methods for estimating wear in non-volatile solid-state memory devices rely heavily on program-erase cycles, which can lead to conservative estimates and unnecessary performance throttling, limiting the devices' potential performance.
Innovation Solution
The system measures completion times of data storage operations to estimate wear, using these metrics to adjust wear metrics and perform life cycle management operations, such as wear leveling and data selection, to more accurately predict and manage the memory device's lifespan.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If wear estimation is based on program-erase cycles, then wear management can be performed, but the estimates are conservative and cause unnecessary performance throttling
Solution Approach 1:
The patent changes the parameter used for wear estimation from program-erase cycle count to data storage operation completion time. This parameter change provides more accurate wear estimation without causing unnecessary performance throttling, as completion time directly reflects the actual wear state of the memory device rather than relying on conservative cycle-based estimates
Solution Approach 2:
The patent replaces the mechanical counting method (program-erase cycle counters) with a timing-based measurement system. By measuring completion times of data storage operations and comparing them to baseline times, the system achieves more accurate wear estimation without the conservatism inherent in cycle-based mechanical counting
2Measurement precision
If completion times are measured for all memory units, then accurate wear estimation is achieved, but the measurement complexity and time increase
Solution Approach 1:
The patent divides the memory device into multiple memory units and measures completion times for each unit independently. This segmentation allows for precise wear estimation at the unit level while enabling parallel measurement processes that reduce overall measurement complexity and time compared to measuring all units sequentially
Solution Approach 2:
The patent measures completion times for a representative sample of memory units rather than requiring exhaustive measurement of every single unit. This partial action approach achieves sufficient measurement precision for accurate wear estimation while significantly reducing the complexity and time required compared to measuring all memory units in detail
Data Source
AI summary
Completion times of data storage operations targeted to a non-volatile, solid-state memory device are measured. Wear of the memory device is estimated using the measured completion times, and life cycle management operations are performed to affect subsequent wear of the memory device in accordance with the estimated wear. The life cycle management may include operations such as wear leveling, predicting an end of service life of the memory device, and removing worn blocks of the memory device from service.