Memory Block Wear Ratio Tracking for Accurate Endurance Metrics
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Solution Overview
Problem
Current dynamic pool compatible memory systems face challenges in accurately tracking wear ratios and PEC counts due to varying erase-program schemes, leading to inaccurate media endurance assessments and premature retirement of memory blocks, which can result in reduced operational lifetimes and system failures.
Innovation Solution
Implementing dynamic wear ratio management by updating a register with erase operation data and calculating wear ratios based on the combination of erase and program operations, allowing for precise tracking of media endurance metrics.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If dynamic pool compatible systems use varying erase-program schemes, then operational flexibility and adaptability are improved, but wear ratio tracking accuracy deteriorates
Solution Approach 1:
The patent segments the wear tracking system by maintaining separate erase counters for different erase operation types (e.g., SLC erase counter, TLC erase counter, QLC erase counter) and separate program counters for different program operation types. This segmentation allows accurate tracking of wear for each specific erase-program scheme while maintaining the ability to adapt to different operational requirements.
Solution Approach 2:
The patent implements dynamic wear ratio management by calculating wear ratios based on the actual combination of erase and program operations performed on memory blocks. The system dynamically adjusts wear tracking by retrieving erase counts and program counts, calculating wear ratios based on these operations, and updating media endurance metric values accordingly. This dynamic approach maintains accuracy while adapting to varying operational schemes.
2Reliability
If wear ratios are overestimated to ensure safety, then reliability is improved, but operational lifetime is reduced due to premature retirement
Solution Approach 1:
The patent implements feedback mechanisms where the system continuously monitors actual erase and program operations performed on memory blocks, calculates accurate wear ratios based on this feedback, and updates media endurance metric values accordingly. This feedback loop ensures that wear is tracked accurately rather than being overestimated, preventing premature retirement while maintaining system reliability through accurate wear assessment.
Solution Approach 2:
The patent changes the parameter tracking approach from using fixed, conservative wear estimates to dynamically calculating wear ratios based on actual operational parameters (erase counts and program counts for different operation types). This parameter change allows the system to adapt wear assessment to actual usage patterns, extending operational lifetime while maintaining reliability.
3Device complexity
If simple wear tracking is used, then device complexity is reduced, but measurement precision of media endurance deteriorates
Solution Approach 1:
The patent segments wear tracking into manageable components: separate erase counters for different erase types, separate program counters for different program types, and a wear ratio calculation mechanism. This segmentation makes the complex tracking task manageable while achieving high measurement precision through detailed monitoring of each operation type.
Solution Approach 2:
The patent introduces intermediary structures (erase counters, program counters, and wear ratio calculation logic) that mediate between the complex variety of erase-program schemes and the simplified media endurance metric update process. These intermediaries organize and process the detailed operational information, making precise wear tracking achievable without overwhelming system complexity.
Data Source
AI summary
A system includes a memory device and a processing device operatively coupled to the memory device. The processing device is to perform operations including performing a program operation on a block of the memory device. The operations further include retrieving, from a metadata structure associated with a block of the memory device, a value reflecting a type and a corresponding number of erase operations performed on the block of the memory device. The operations further include determining a wear ratio based on the value reflecting the type and the corresponding number of erase operations and the program operation. The operations further include updating, based on the determined wear ratio, a media endurance metric value of the block of the memory device.