Semiconductor Memory Wiring Line Structure Design

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Solution Overview

Problem

As semiconductor memory devices trend towards larger capacity and higher integration, the complexity and area occupancy of wiring lines increase, making it difficult to design efficient wiring line structures within limited space.

Innovation Solution

A semiconductor memory device with a three-dimensional structure featuring a novel wiring line configuration, including step-shaped grooves and slit-divided electrode structures, which reduces the area occupied by wiring lines and allows for more efficient electrical coupling without increasing the size of memory blocks or the number of wiring line layers.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If the number of wiring lines is increased to support larger capacity and higher integration, then the data storage capacity is improved, but the area occupied by wiring lines increases and the structure becomes more complex

Engineering Contradiction:
Improvedata storage capacityVSAvoidarea occupied by wiring lines
Core Design Contradiction:
Quantity of substanceVSArea of stationary object

Solution Approach 1:

The patent transitions from planar wiring to three-dimensional wiring structures, including vertical wiring lines extending through multiple layers and bent wiring lines that utilize the third dimension (vertical direction) to route signals. This allows wiring lines to be arranged in multiple levels and directions, significantly increasing the number of interconnections without proportionally increasing the planar area occupied by the wiring layer.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent implements nested wiring structures where wiring lines are embedded within multi-layered dielectric structures. Conductive lines are nested within dielectric layers, and multiple wiring layers are stacked vertically with each layer nested within the overall device structure. This nesting approach allows dense packing of wiring lines while maintaining electrical isolation and reducing the effective area footprint.

Inventive Principle:
Principle #7Nested doll (Nesting)

2Quantity of substance

If the number of wiring lines is increased to support larger capacity and higher integration, then the data storage capacity is improved, but the wiring line structure becomes more complex

Engineering Contradiction:
Improvedata storage capacityVSAvoidwiring line structure complexity
Core Design Contradiction:
Quantity of substanceVSDevice complexity

Solution Approach 1:

The patent divides the wiring structure into multiple discrete layers, with each layer containing specific wiring lines for particular functions. The device is segmented into active regions, inactive regions, and different functional blocks, each with dedicated wiring layers. This segmentation allows independent design and optimization of each wiring layer, reducing the overall complexity by breaking down the monolithic wiring problem into manageable modular components.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent designs wiring lines and interconnect structures that serve multiple functions simultaneously. For example, certain conductive lines serve as both bit lines and word lines in different operational modes, and dielectric layers provide both electrical isolation and mechanical support. This multi-functionality reduces the total number of dedicated wiring lines needed, simplifying the overall wiring structure while maintaining high data storage capacity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Quantity of substance

If the area allocated for wiring lines is decreased to accommodate more storage, then the data storage capacity is improved, but it becomes more difficult to design efficient wiring line structures

Engineering Contradiction:
Improvedata storage capacityVSAvoidease of wiring line design
Core Design Contradiction:
Quantity of substanceVSEase of manufacture

Solution Approach 1:

By utilizing vertical dimensions and multiple stacking layers, the patent achieves high-density wiring interconnections within a reduced planar footprint. The third dimension provides additional routing space, allowing wiring lines to bypass obstacles and connect to distant pads without requiring excessive lateral space, thus simplifying the design process despite area constraints.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent introduces dielectric layers and intermediate conductive structures that facilitate wiring connections. These intermediary elements provide standardized interfaces and routing paths between different functional blocks, making the wiring design more systematic and easier to manage. The intermediate structures act as mediators that simplify the complexity of direct point-to-point wiring design in high-density configurations.

Inventive Principle:
Principle #24Intermediary (Mediator)

Data Source

PatentUS11195852B2Semiconductor memory device having wiring line structure
Publication Date: 2021.12.07 SK HYNIX INC
  • US11195852B2 patent drawing
  • US11195852B2 patent drawing
  • US11195852B2 patent drawing

AI summary

A semiconductor memory device includes a substrate having a second region extending in a first direction; a memory block including electrodes; a slit dividing the memory block into first and second electrode structures in the second region; and step-shaped grooves formed in the memory block in the second region, and divided by the slit. In the second region, the first and second electrode structures are adjacently disposed with the slit interposed therebetween, in a second direction intersecting with the first direction. Each of the electrodes of the first electrode structure has a first pad region, each of the electrodes of the second electrode structure has a second pad region, and first and second pad regions of the first and second electrode structures which are positioned in the same step-shaped groove and are disposed at the same layers are adjacently disposed in the second direction with the slit interposed therebetween.