Nonvolatile Memory Word Line Recovery Voltage Management

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Solution Overview

Problem

Nonvolatile memory devices face challenges in reducing read disturbance and improving operational efficiency, particularly in setting up word lines and managing voltages during read operations.

Innovation Solution

The method involves floating word lines with a recovery voltage higher than ground voltage during recovery operations, which reduces read disturbance by preventing the formation of channel-off ranges and allows for faster word line setup times.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Object-affected harmful factors

If word lines are discharged to ground voltage during recovery operation, then read disturbance is reduced, but word line setup time increases

Engineering Contradiction:
Improveread disturbanceVSAvoidword line setup time
Core Design Contradiction:
Object-affected harmful factorsVSLoss of time

Solution Approach 1:

The patent applies preliminary action by pre-charging bit lines to a first voltage level before read operations and maintaining word lines at a first voltage level (not ground) during recovery. This preliminary preparation eliminates the need for time-consuming voltage transitions during actual read operations, thereby reducing read disturbance while minimizing setup time penalties

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent changes the voltage parameter of word lines during recovery operation, maintaining them at a first voltage level (such as read pass voltage or intermediate voltage) rather than discharging to ground voltage. This parameter change allows faster transition to operational voltages and reduces the formation of channel-off ranges, thereby reducing read disturbance while improving setup speed

Inventive Principle:
Principle #35Parameter changes

2Loss of time

If word lines are maintained at higher voltage during recovery, then word line setup time is reduced, but read disturbance increases

Engineering Contradiction:
Improveword line setup timeVSAvoidread disturbance
Core Design Contradiction:
Loss of timeVSObject-affected harmful factors

Solution Approach 1:

The patent applies local quality by differentiating voltage levels for different word lines during recovery operation. Selected word lines are maintained at appropriate voltage levels while unselected word lines can be discharged to ground voltage. This localized voltage management reduces read disturbance in unselected regions while maintaining fast setup characteristics in selected regions

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent uses preliminary action by pre-charging bit lines to appropriate voltage levels before read operations. This preliminary preparation ensures that when read operations commence, the bit lines are already in the correct state, allowing word lines to be maintained at higher voltages during recovery without causing excessive read disturbance, as the bit line charging compensates for potential interference

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS9837164B2Nonvolatile memory device, storage device having the same, and operation and read methods thereof
Publication Date: 2017.12.05 SAMSUNG ELECTRONICS CO LTD
  • US9837164B2 patent drawing
  • US9837164B2 patent drawing
  • US9837164B2 patent drawing

AI summary

A method is for operating a nonvolatile memory device, the nonvolatile memory device including at least one string connected to a bit line, the at least one string including a plurality of memory cells connected in series, each of the plurality of memory cells being connected to a respective word line among a plurality of word lines and stacked in a direction perpendicular to a substrate. The method includes applying a word line voltage needed for an operation to a first word line among the word lines, applying a recovery voltage higher than a ground voltage to the first word line after the operation, and then floating the first word line.