MEMS Discharge Circuit with Spark Gap for ESD Protection

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Solution Overview

Problem

Microelectromechanical systems (MEMS) devices are vulnerable to electrostatic discharge (ESD) events, which can cause immediate failures and long-term reliability issues due to electrical overstress, particularly in applications where hot switching operations are common, leading to damage of contacts and dielectrics.

Innovation Solution

Incorporating a discharge circuit with a spark gap assembly featuring shaped conductive features and a preferred arcing path, configured to provide protection during ESD events by routing the discharge away from sensitive areas, such as contact pads, and allowing arcing at lower potential differences, thereby preventing damage to the MEMS device.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a discharge circuit with spark gap assembly is added to protect MEMS devices from ESD, then reliability is improved, but device complexity increases

Engineering Contradiction:
Improveprotection from electrostatic dischargeVSAvoidcircuit structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The discharge circuit is integrated within the MEMS device structure itself, with the spark gap assembly nested among the electromechanical components. The conductive features are formed as part of the device architecture, allowing the protection function to be embedded without adding external complexity.

Inventive Principle:
Principle #7Nested doll (Nesting)

Solution Approach 2:

The spark gap assembly provides automatic discharge protection without requiring external control or intervention. When ESD events occur, the shaped conductive features automatically create preferred arcing paths that redirect the discharge away from sensitive areas, making the system self-protecting.

Inventive Principle:
Principle #25Self-service

2Reliability

If shaped conductive features are used to create preferred arcing paths, then discharge protection effectiveness is improved, but manufacturing precision requirements increase

Engineering Contradiction:
Improvedischarge protection effectivenessVSAvoidconductive feature geometry
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The patent employs standard photolithography and etching processes to create the shaped conductive features, using conventional manufacturing parameters rather than requiring ultra-precise specialized processes. The geometry is defined through standard fabrication techniques that are already part of MEMS manufacturing workflows.

Inventive Principle:
Principle #35Parameter changes

3Reliability

If the spark gap assembly is positioned away from the electromechanical assembly, then discharge protection is improved, but device area increases

Engineering Contradiction:
Improvedischarge protectionVSAvoiddevice footprint
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The spark gap assembly is positioned in the spaces between existing electromechanical components, utilizing unused areas within the device footprint. The conductive features are integrated into the available volume without requiring additional external space, effectively nesting the protection structure within the existing device architecture.

Inventive Principle:
Principle #7Nested doll (Nesting)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The discharge circuit effectively protects MEMS devices from ESD by providing a preferred arcing path that reduces the risk of damage during both hot and cold switching operations, ensuring the reliability and longevity of the devices by dissipating charge without harming the electromechanical assembly.

Implementation Method 1

The discharge circuit can include a spark gap assembly having one or more spark gap elements configured to facilitate the preferred arcing path

Methodology Applied
Scientific EffectElectrical breakdown: Electric Arc

Implementation Method 2

The contact switch device can further include a gate configured to provide an electrostatic force to the beam to thereby allow the beam to be in the first state or the second state

Methodology Applied
Scientific EffectElectrostatic force: Electrostatics

Data Source

PatentUS10865101B2Discharge circuits, devices and methods
Publication Date: 2020.12.15 SKYWORKS SOLUTIONS INC
  • US10865101B2 patent drawing
  • US10865101B2 patent drawing
  • US10865101B2 patent drawing

AI summary

Discharge circuits, devices and methods. In some embodiments, a MEMS device can include a substrate and an electromechanical assembly implemented on the substrate. The MEMS device can further include a discharge circuit implemented relative to the electromechanical assembly. The discharge circuit can be configured to provide a preferred arcing path during a discharge condition affecting the electromechanical assembly. The MEMS device can be, for example, a switching device, a capacitance device, a gyroscope sensor device, an accelerometer device, a surface acoustic wave (SAW) device, or a bulk acoustic wave (BAW) device. The discharge circuit can include a spark gap assembly having one or more spark gap elements configured to facilitate the preferred arcing path.