Hydrophobic Semiconductor Layer for MEMS Adhesion

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Solution Overview

Problem

The bonding process of Micro-Electro-Mechanical Systems (MEMS) devices with a cap substrate often results in adhesion failures, leading to poor reliability due to the use of hydrophobic compounds that generate byproducts like water, which act as outgassing sources.

Innovation Solution

A hydrophobic semiconductor layer made of germanium (Ge), silicon (Si), or their combination is applied to the surfaces facing the MEMS devices, which reduces adhesion and is formed through a recrystallization process to achieve a high water contact angle, eliminating the need for hydrophobic compounds and their byproducts.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If hydrophobic compounds are used to reduce adhesion, then adhesion resistance is improved, but harmful byproducts like water are generated causing outgassing

Engineering Contradiction:
Improveadhesion resistanceVSAvoidoutgassing
Core Design Contradiction:
ReliabilityVSObject-generated harmful factors

Solution Approach 1:

The patent extracts and eliminates the harmful hydrophobic compound layer entirely, replacing it with a hydrophobic semiconductor layer made of intrinsic semiconductor materials (silicon, germanium, or their alloys). This extraction removes the source of harmful byproducts while preserving the essential adhesion resistance function through the inherent hydrophobic properties of the semiconductor material itself.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent changes the material parameter from organic hydrophobic compounds to inorganic hydrophobic semiconductor materials. This parameter change transforms the system from one that generates harmful byproducts to one that provides adhesion resistance through the inherent properties of the semiconductor material, eliminating outgassing while maintaining reliability.

Inventive Principle:
Principle #35Parameter changes

2Reliability

If hydrophobic compounds are applied to surfaces, then adhesion is reduced, but the bonding process reliability deteriorates due to byproduct generation

Engineering Contradiction:
Improvebonding process reliabilityVSAvoidbyproduct generation
Core Design Contradiction:
ReliabilityVSObject-generated harmful factors

Solution Approach 1:

The patent converts the harmful effect of byproduct generation into a benefit by using a material (hydrophobic semiconductor layer) that provides the desired adhesion resistance function without generating harmful byproducts. The inherent hydrophobicity of the semiconductor material serves the protective function while the material's stability ensures no harmful emissions during bonding or operation.

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

3Ease of manufacture

If conventional bonding processes are used, then manufacturing is simplified, but adhesion failures occur reducing reliability

Engineering Contradiction:
Improvebonding process simplicityVSAvoidadhesion reliability
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The patent applies preliminary action by forming the hydrophobic semiconductor layer on the substrate surfaces before the bonding process. This preliminary coating prepares the surfaces to inherently resist adhesion during subsequent bonding operations, preventing adhesion failures while maintaining manufacturing simplicity through a straightforward deposition and recrystallization sequence.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent changes the surface property parameter by depositing a hydrophobic semiconductor layer with specific crystalline structure and orientation. This parameter change creates surfaces that naturally resist adhesion to other surfaces, preventing bonding failures while requiring only standard semiconductor fabrication processes, thus maintaining ease of manufacture.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The hydrophobic semiconductor layer effectively reduces adhesion between the MEMS devices and surrounding surfaces, enhancing the reliability of the bonding process by preventing the issues associated with hydrophobic compound byproducts.

Implementation Method 1

A hydrophobic semiconductor layer made of germanium (Ge), silicon (Si), or their combination is applied to the surfaces facing the MEMS devices, which reduces adhesion and is formed through a recrystallization process to achieve a high water contact angle

Methodology Applied
Scientific EffectHydrophobicity: Hydrophobe

Implementation Method 2

A hydrophobic semiconductor layer made of germanium (Ge), silicon (Si), or their combination is applied to the surfaces facing the MEMS devices, which reduces adhesion and is formed through a recrystallization process to achieve a high water contact angle

Methodology Applied
Scientific EffectRecrystallization: Crystallisation

Data Source

PatentUS9481567B2MEMS structure, cap substrate and method of fabricating the same
Publication Date: 2016.11.01 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US9481567B2 patent drawing
  • US9481567B2 patent drawing
  • US9481567B2 patent drawing

AI summary

A micro electro mechanical system (MEMS) structure is provided, which includes a first substrate, a second substrate, a MEMS device and a hydrophobic semiconductor layer. The first substrate has a first portion. The second substrate is substantially parallel to the first substrate and has a second portion substantially aligned with the first portion. The MEMS device is between the first portion and the second portion. The hydrophobic semiconductor layer is made of germanium (Ge), silicon (Si) or a combination thereof on the first portion, the second portion or the first portion and the second portion and faces toward the MEMS device. A cap substrate for a MEMS device and a method of fabricating the same are also provided.