MEMS Surface Fluorescence Reduction via Low Energy Ion Beam

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Solution Overview

Problem

Microelectromechanical system (MEMS) materials used in analytical devices, such as those for nanopore sequencing, often exhibit optical activity, leading to background fluorescence that obscures low-level fluorescent signals, complicating optically based measurements.

Innovation Solution

Treating the surface of MEMS materials with a low energy ion beam to reduce or eliminate autofluorescence, specifically using helium ion beams to disrupt structures contributing to fluorescence without causing damage, thereby minimizing background noise in optical detection systems.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If MEMS materials are used in analytical devices, then chemical inertness, strength, and rigidity are improved, but background fluorescence increases obscuring optical signals

Engineering Contradiction:
Improvechemical inertnessVSAvoidbackground fluorescence
Core Design Contradiction:
ReliabilityVSObject-generated harmful factors

Solution Approach 1:

The patent applies preliminary action by treating the MEMS material surface with an ion beam before optical detection to preemptively reduce background fluorescence. This pre-treatment modifies the surface properties to minimize autofluorescence generation, allowing subsequent optical measurements to proceed with reduced background interference while maintaining the material's chemical inertness and structural integrity.

Inventive Principle:
Principle #10Preliminary action

2Object-generated harmful factors

If high energy ion beam is used to reduce fluorescence, then background fluorescence is reduced, but material damage occurs

Engineering Contradiction:
Improvebackground fluorescenceVSAvoidmaterial integrity
Core Design Contradiction:
Object-generated harmful factorsVSStrength

Solution Approach 1:

The patent applies parameter changes by carefully controlling the ion beam energy to be sufficient for reducing background fluorescence but below the threshold that causes material damage. By optimizing the ion beam parameters (energy, flux, duration), the treatment achieves fluorescence reduction while preserving the mechanical strength and structural integrity of the MEMS material.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The method effectively reduces background fluorescence, enhancing the accuracy of optical detection in devices like nanopore sequencing by minimizing unwanted optical signals, allowing for clearer measurement of low-level fluorescent signals.

Implementation Method 1

treating a surface of the MEMS material with a low energy ion beam

Methodology Applied
Scientific EffectIon beam treatment: Ion Beam

Data Source

PatentUS9651539B2Reducing background fluorescence in MEMS materials by low energy ion beam treatment
Publication Date: 2017.05.16 SWITCHBACK SYSTEMS INC
  • US9651539B2 patent drawing
  • US9651539B2 patent drawing
  • US9651539B2 patent drawing

AI summary

Methods for fabricating materials useful for optical detection in microfluidic and nanofluidic devices, such as those used in nanopore-based nucleic acid sequencing are described herein. In certain variations, a method of reducing background fluorescence in a MEMS material may include the step of treating a surface of the MEMS material with a low energy ion beam.