MEMS Device Multi-Pressure Sealed Cavities

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Solution Overview

Problem

The integration of MEMS devices into integrated circuit manufacturing processes poses challenges, particularly in electrically interconnecting them, as existing methods struggle to efficiently manage the unique requirements of miniaturized MEMS devices within a single chip.

Innovation Solution

The described method involves forming MEMS devices in sealed cavities with different pressures using a substrate bonding process, where a cap wafer with an out-gas layer is bonded to a substrate, and the out-gas layer is annealed to increase the pressure in one cavity, allowing for the simultaneous integration of MEMS devices like gyroscopes and accelerometers on a single chip with varying pressure conditions.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If MEMS devices are integrated into integrated circuit manufacturing processes, then productivity and miniaturization are improved, but device complexity and manufacturing difficulty increase

Engineering Contradiction:
Improveintegration efficiencyVSAvoidmanufacturing complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The patent divides the integrated circuit chip into multiple sealed cavities, each containing specific MEMS devices. This segmentation allows different MEMS devices to operate under different pressure conditions while maintaining a unified manufacturing process, thereby improving integration efficiency without significantly increasing manufacturing complexity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent creates localized environments within sealed cavities by bonding cap wafers to the substrate, forming isolated chambers with controlled pressure conditions. This local quality approach allows different regions of the chip to have different pressure environments suitable for different MEMS device types, resolving the conflict between integration efficiency and manufacturing complexity.

Inventive Principle:
Principle #3Local quality

2Adaptability or versatility

If multiple MEMS devices with different pressure conditions are integrated on a single chip, then adaptability is improved, but manufacturing precision requirements increase

Engineering Contradiction:
Improvepressure condition varietyVSAvoidcavity sealing precision
Core Design Contradiction:
Adaptability or versatilityVSManufacturing precision

Solution Approach 1:

The patent performs preliminary actions by forming the sealed cavities and placing MEMS devices within them before final bonding. The cap wafer is prepared with appropriate thickness and material properties in advance, and MEMS devices are positioned in their respective cavities before the bonding process seals the pressure environments. This preliminary action approach allows for better control of manufacturing precision while achieving diverse pressure conditions.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent controls pressure conditions by adjusting parameters such as cap wafer thickness, bonding temperature, and cavity volume. By changing these parameters, different pressure environments are created within sealed cavities without requiring fundamentally different manufacturing processes, thus improving adaptability while managing manufacturing precision requirements.

Inventive Principle:
Principle #35Parameter changes

3Reliability

If cap wafer bonding is used to form sealed cavities, then reliability is improved, but additional process steps increase device complexity

Engineering Contradiction:
Improvecavity sealing reliabilityVSAvoidprocess steps
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent merges the cavity sealing function with the existing cap wafer structure by bonding the cap wafer directly to the substrate. This combines multiple functions (sealing, structural support, and pressure control) into a single component and process step, improving reliability without significantly increasing overall device complexity.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The cap wafer serves multiple functions: it provides the sealing structure for sealed cavities, supports the out-gas layer for pressure control, and acts as part of the mechanical structure. This multi-functionality reduces the need for additional separate components and process steps, thereby improving reliability while limiting increases in device complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables the smooth integration of MEMS devices with different pressure conditions within the same manufacturing process, enhancing the sensitivity and reliability of MEMS chips by maintaining minimal additional costs and complexity.

Implementation Method 1

The out gas layer is annealed to release gas from the out gas layer into the second sealed cavity and increase a pressure of the second sealed cavity

Methodology Applied
Scientific EffectAnnealing: Annealing

Data Source

PatentUS10266400B2MEMS device with multi pressure
Publication Date: 2019.04.23 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US10266400B2 patent drawing
  • US10266400B2 patent drawing
  • US10266400B2 patent drawing

AI summary

Micro-electromechanical (MEMS) devices and methods of forming are provided. The MEMS device includes a first substrate including a first conductive feature, a first movable element positioned over the first conductive feature, a second conductive feature, and a second movable element positioned over the second conductive feature. The MEMS device also includes a cap bonded to the first substrate, where the cap and the first substrate define a first sealed cavity and a second sealed cavity. The first conductive feature and the first movable element are disposed in the first sealed cavity and the second conductive feature and the second movable element are disposed in the second sealed cavity. A pressure of the second cavity is higher than a pressure of the first sealed cavity, and an out gas layer is disposed in a recess of the cap that partially defines the second sealed cavity.