MEMS Stiction Reduction via Nanocluster Surface Roughness

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Solution Overview

Problem

MEMS devices face stiction issues due to electrostatic, Van der Waals, and hydrogen bonding forces, which can cause mechanical parts to adhere and become unusable, and traditional methods to mitigate this often decrease device sensitivity.

Innovation Solution

A micro-masking layer of nanoclusters, such as poly silicon or poly germanium, is formed on a sacrificial layer to increase surface roughness, reducing the contact area between moving parts and thereby decreasing stiction forces, achieved through etching processes that impart roughness characteristics to the surface.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If traditional methods are used to avoid close proximity contact (increasing spring constants or distance between parts), then stiction-related adhesion is reduced, but device sensitivity decreases

Engineering Contradiction:
Improvestiction resistanceVSAvoiddevice sensitivity
Core Design Contradiction:
ReliabilityVSMeasurement precision

Solution Approach 1:

The patent applies local quality by creating nanoscale roughness features (nanoclusters) only at specific contact regions of the MEMS device surfaces. This localized surface modification reduces stiction at contact points while preserving the overall smoothness and sensitivity of the device. The nanoclusters are formed by selective deposition or self-assembly at intended contact zones, providing targeted stiction reduction without affecting other device regions.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent changes the surface parameter (roughness) at the nanoscale level by introducing nanocluster structures with specific size distributions (typically 10-100 nm). This parameter change reduces the real contact area between surfaces while maintaining nominal geometric contact, thereby reducing stiction forces. The surface roughness parameter is precisely controlled to optimize both stiction reduction and device sensitivity.

Inventive Principle:
Principle #35Parameter changes

2Reliability

If surface area between contacting surfaces is increased to reduce stiction, then device size increases, but compact system design is compromised

Engineering Contradiction:
Improvestiction resistanceVSAvoiddevice size
Core Design Contradiction:
ReliabilityVSVolume of moving object

Solution Approach 1:

The patent transitions from macroscopic surface area modification to nanoscale surface feature modification. Instead of increasing surface area in the macro dimension, the invention introduces vertical nanoscale features (nanoclusters) that reduce stiction through decreased real contact area. This dimensional shift allows stiction reduction without increasing overall device footprint, enabling compact MEMS designs.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach effectively reduces stiction forces without compromising the sensitivity of MEMS devices, allowing for lower spring constants and smaller device sizes, thereby improving sensitivity and enabling more compact systems.

Implementation Method 1

forming a plurality of nanoclusters on the sacrificial layer... The nanoclusters provide a micro-masking layer for the etching

Methodology Applied
Scientific EffectPhysical Vapour Deposition: Physical Vapour Deposition

Data Source

PatentUS9776853B2Reducing MEMS stiction by deposition of nanoclusters
Publication Date: 2017.10.03 STMICROELECTRONICS INT NV
  • US9776853B2 patent drawing
  • US9776853B2 patent drawing
  • US9776853B2 patent drawing

AI summary

A mechanism for reducing stiction in a MEMS device by decreasing surface area between two surfaces that can come into close contact is provided. Reduction in contact surface area is achieved by increasing surface roughness of one or both of the surfaces. The increased roughness is provided by forming a micro-masking layer on a sacrificial layer used in formation of the MEMS device, and then etching the surface of the sacrificial layer. The micro-masking layer can be formed using nanoclusters. When a next portion of the MEMS device is formed on the sacrificial layer, this portion will take on the roughness characteristics imparted on the sacrificial layer by the etch process. The rougher surface decreases the surface area available for contact in the MEMS device and, in turn, decreases the area through which stiction can be imparted.