MEMS Packaging With Integrated Metal Cap Shielding

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Solution Overview

Problem

Current wafer level packaging methods for MEMS devices fail to integrate electromagnetic shielding while maintaining a small form factor, necessitating additional processes and offsetting the MEMS device position due to vertical release vias.

Innovation Solution

A method involving a metal cap partially anchored to a wafer with an unanchored portion, extending over the MEMS device, and a sealing layer to encapsulate it, where the electrical contact pad and metal cap share the same composition, allowing for integrated electromagnetic shielding and reduced process steps.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Length of stationary object

If wafer level capping is used to package MEMS devices, then the package form factor is reduced to 200-250 um, but additional processes are required to form separate EM shields and the device position must be offset due to vertical release vias

Engineering Contradiction:
Improvepackage thicknessVSAvoidpackaging process complexity
Core Design Contradiction:
Length of stationary objectVSDevice complexity

Solution Approach 1:

The patent combines the electromagnetic shielding function with the redistribution layer by forming both structures from the same metal layer in a single deposition process. The metal layer serves dual purposes: as the redistribution layer for electrical connections and as the electromagnetic shield for EM interference protection, eliminating the need for separate EM shield formation processes

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The metal layer is designed to perform multiple functions simultaneously: electrical redistribution, electromagnetic shielding, and structural support. This multi-functional approach reduces the number of process steps and integrates EM shielding capabilities into the standard wafer level packaging flow without requiring additional specialized processes

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Object-affected harmful factors

If separate EM shield structures are added to provide electromagnetic shielding, then EM interference protection is improved, but the package thickness increases and manufacturing complexity increases

Engineering Contradiction:
ImproveEM interference protectionVSAvoidpackage thickness
Core Design Contradiction:
Object-affected harmful factorsVSLength of stationary object

Solution Approach 1:

The electromagnetic shielding function is merged with the redistribution layer function. Both structures are formed from the same metal layer deposited in a single process step, eliminating the need for additional EM shield layers and reducing overall package thickness while maintaining EM interference protection

Inventive Principle:
Principle #5Merging (Combining)

3Volume of stationary object

If vertical release vias are used to form cavities, then cavity formation is achieved, but device position must be offset and additional process steps are required

Engineering Contradiction:
Improvecavity formationVSAvoidprocess steps and device positioning
Core Design Contradiction:
Volume of stationary objectVSDevice complexity

Solution Approach 1:

The patent transitions from vertical release vias (vertical dimension) to lateral release vias (horizontal dimension). This dimensional change allows cavity formation without offsetting the device position, as the lateral vias are formed at the side of the device structure rather than through the bottom, eliminating the need for positional compensation

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Data Source

PatentUS11286157B2Methods for packaging a microelectromechanical systems device
Publication Date: 2022.03.29 VANGUARD INT SEMICON SINGAPORE PTE LTD
  • US11286157B2 patent drawing
  • US11286157B2 patent drawing
  • US11286157B2 patent drawing

AI summary

A method for packaging a MEMS device includes the following steps. A metal cap is provided that is partially anchored to a wafer comprising the MEMS device where at least one point between the cap and the wafer is unanchored, the metal cap arranged to at least substantially extend over the MEMS device. An electrical contact pad is electrically coupled to the MEMS device. A sealing layer is provided over the metal cap and the wafer such that the sealing layer seals a gap between an unanchored portion of the metal cap and the wafer to encapsulate the MEMS device, where the electrical contact pad and the metal cap include the same composition.