MEMS Cavity Encapsulation Using PVD to Avoid Internal Coating

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Conformal deposition in chemical vapor deposition (CVD) processes leads to unwanted coating of microscale features inside MEMS devices, disrupting electrical connections and device operation.

Innovation Solution

Employing physical vapor deposition (PVD) for encapsulation, which is less conformal, forming islands of dielectric material outside the cavity and avoiding coating of internal features, ensuring hermetic sealing without interfering with device operation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If chemical vapor deposition (CVD) is used for encapsulation, then hermetic sealing is achieved, but unwanted coating of microscale features inside the cavity occurs, disrupting electrical connections

Engineering Contradiction:
Improvehermetic sealingVSAvoidunwanted coating on microscale features
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The patent changes the deposition process parameter from chemical vapor deposition to physical vapor deposition. This parameter change fundamentally alters the deposition characteristics, allowing the film to be deposited only on surfaces exposed to the deposition chamber (external surfaces) while avoiding coating of internal microscale features that are not exposed to the chamber environment.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent extracts the harmful conformal deposition characteristic from the encapsulation process. By using PVD instead of CVD, the process selectively deposits film only where needed (on external surfaces for hermetic sealing) while excluding the unwanted coating effect from internal cavity features.

Inventive Principle:
Principle #2Taking out (Extraction)

2Manufacturing precision

If conformal deposition is used for encapsulation, then complete coverage is achieved, but coating of internal features disrupts device operation

Engineering Contradiction:
Improvecomplete coverageVSAvoiddevice operation
Core Design Contradiction:
Manufacturing precisionVSReliability

Solution Approach 1:

The patent applies local quality by making the deposition process non-conformal. The film is deposited only on specific local areas (external surfaces of the device structure) rather than uniformly on all surfaces. This allows hermetic sealing where needed while avoiding coating of internal features that would disrupt device operation.

Inventive Principle:
Principle #3Local quality

3Reliability

If CVD process is used for encapsulation, then hermetic protection is provided, but package size and cost increase

Engineering Contradiction:
Improvehermetic protectionVSAvoidpackage size and cost
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent extracts the hermetic sealing function from the CVD process and implements it through PVD. This extraction allows for a simplified package structure that achieves the same hermetic protection with reduced complexity, smaller package size, and lower cost.

Inventive Principle:
Principle #2Taking out (Extraction)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

PVD-based encapsulation prevents unwanted coating on sensitive microscale features, maintaining electrical connectivity and reducing package size and cost while providing effective hermetic protection.

Implementation Method 1

sealing at least a portion of the MEMS device including the one or more release holes with a film utilizing a physical vapor deposition (PVD) process

Methodology Applied
Scientific EffectPhysical vapor deposition: Physical Vapour Deposition

Data Source

PatentUS20260035238A1Device encapsulation using physical vapor deposition
Publication Date: 2026.02.05 TEXAS INSTRUMENTS INC
  • US20260035238A1 patent drawing
  • US20260035238A1 patent drawing
  • US20260035238A1 patent drawing

AI summary

A method includes forming a microelectromechanical system (MEMS) device wherein the MEMS device includes a cavity and one or more release holes extending from a surface of the MEMS device to the cavity, and sealing at least a portion of the MEMS device including the one or more release holes with a film utilizing a physical vapor deposition (PVD) process.