Meta-Optical Layer Stack for Low-Reflectance Etch Protection

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Solution Overview

Problem

Existing diffractive optical devices face challenges in reducing reflectance due to the limitations of etch stop layers, which are restricted by the need for materials with lower etch rates and specific refractive indices, limiting the reduction of reflectance.

Innovation Solution

The meta-optical device incorporates a first functional layer with a combination of layers having different etch rates and refractive indices, and an antireflective layer to minimize reflectance at interfaces, using materials like silicon nitride and hafnium oxide to achieve optimal refractive index matching.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If an etch stop layer is used to protect lower layers during etching, then manufacturing reliability is improved, but reflectance increases due to refractive index mismatch

Engineering Contradiction:
Improveetch stop layer protectionVSAvoidreflectance
Core Design Contradiction:
ReliabilityVSObject-generated harmful factors

Solution Approach 1:

The patent uses a composite structure consisting of the etch stop layer combined with a first functional layer and a second functional layer. Each layer has specifically selected refractive indices that form a gradient transition, reducing overall reflectance while maintaining the etch stop layer's protective function. The etch stop layer (e.g., silicon nitride) is combined with hafnium oxide and silicon oxide layers to create a multi-material system that addresses both protection and optical performance.

Inventive Principle:
Principle #40Composite materials

Solution Approach 2:

The patent changes the refractive index parameter by introducing functional layers with intermediate refractive indices between the etch stop layer and adjacent meta-structure layers. The first functional layer has a refractive index higher than the etch stop layer, and the second functional layer has a refractive index lower than the etch stop layer, creating a gradual transition that reduces reflectance without compromising the etch stop layer's etch rate properties.

Inventive Principle:
Principle #35Parameter changes

2Manufacturing precision

If materials with specific etch rates are selected for the etch stop layer, then manufacturing precision is improved, but material selection is limited

Engineering Contradiction:
Improveetch rate controlVSAvoidmaterial selection
Core Design Contradiction:
Manufacturing precisionVSAdaptability or versatility

Solution Approach 1:

The patent introduces functional layers as intermediary elements between the etch stop layer and the meta-structure layers. These functional layers (first and second functional layers) serve as mediators that optically couple the etch stop layer to the adjacent layers, reducing reflectance. This allows the etch stop layer to maintain its specific material properties for etching control while the functional layers provide the necessary optical transition.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent segments the interface region into multiple distinct layers: the etch stop layer, the first functional layer, and the second functional layer. Each segment has a specific thickness and refractive index optimized for its function. The etch stop layer segment provides protection and etch control, while the functional layer segments provide optical transition, collectively solving both manufacturing precision and optical performance requirements.

Inventive Principle:
Principle #1Segmentation

3Object-generated harmful factors

If the refractive index of the etch stop layer is adjusted to reduce reflectance, then optical performance is improved, but the ability to control etch rate is compromised

Engineering Contradiction:
Improvereflectance reductionVSAvoidetch rate control
Core Design Contradiction:
Object-generated harmful factorsVSEase of manufacture

Solution Approach 1:

The patent creates a composite structure where the etch stop layer maintains its original material composition and etch rate properties, while the added functional layers (first and second functional layers) provide the refractive index transition needed for reflectance reduction. This composite approach allows independent optimization of etching characteristics and optical performance without compromising either aspect.

Inventive Principle:
Principle #40Composite materials

Solution Approach 2:

The patent applies local quality by assigning different functional properties to different layers: the etch stop layer is optimized for manufacturing control with its specific etch rate, while the functional layers are optimized for optical performance with their intermediate refractive indices. Each layer performs its specialized function locally, and the combination achieves both manufacturing precision and reduced reflectance.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This design effectively reduces reflectance, maintaining the desired optical performance and phase modulation capabilities while protecting the underlying layers during manufacturing, enhancing the efficiency of the meta-optical device.

Implementation Method 1

a first functional layer provided between the first meta-structure layer and the second meta-structure layer, the first functional layer including a first layer with an etch rate lower than an etch rate of a second peripheral material, and a second layer having a refractive index different from a refractive index of the first layer

Methodology Applied
Scientific EffectRefraction: Refraction

Data Source

PatentUS12517281B2Meta-optical device and electronic device including the same
Publication Date: 2026.01.06 SAMSUNG ELECTRONICS CO LTD
  • US12517281B2 patent drawing
  • US12517281B2 patent drawing
  • US12517281B2 patent drawing

AI summary

Provided is a meta-optical device including a substrate, a first meta-structure layer provided on the substrate, the first meta-structure layer including a first nanostructure having a sub-wavelength shape dimension and a first peripheral material provided adjacent to the first nanostructure, a second meta-structure layer provided on the first meta-structure layer, the second meta-structure layer including a second nanostructure having the sub-wavelength shape dimension and a second peripheral material provided adjacent to the second nanostructure, and a first functional layer provided between the first meta-structure layer and the second meta-structure layer, the first functional layer including a first-first layer having an etch rate that is lower than an etch rate of the second peripheral material, and a first-second layer having a refractive index that is different from a refractive index of the first-first layer.