Meta Surface Fourier-Transform Interferometer for Compact Spectral Analysis

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Solution Overview

Problem

Conventional Fourier transform interferometers face challenges in miniaturization for integration into small electronic devices due to their mechanical structure for changing the phase of reflected light, making it difficult to manufacture in a compact chip form.

Innovation Solution

A Fourier-transform interferometer utilizing a phase change plate with a reflective layer and a meta surface that locally and differently changes the phase of reflected light, combined with a transflective mirror and photodetector to detect interference patterns, eliminating the need for mechanical mirror movement.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a mechanical mirror movement structure is used to change the phase of reflected light, then the interferometer can achieve spectral analysis functionality, but the device size and complexity increase making it difficult to manufacture in compact chip form

Engineering Contradiction:
Improvespectral analysis capabilityVSAvoidmechanical structure complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent replaces the mechanical mirror movement system with a meta surface that uses optical phase modulation to achieve the same spectral analysis function. The meta surface consists of sub-wavelength structures that directly modulate the phase of reflected light without requiring any mechanical movement, thereby eliminating the complexity of mechanical components while maintaining the interferometric spectral analysis capability

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent changes the operational parameter from mechanical displacement to optical phase modulation. By using meta surface structures with varying geometries (different heights, widths, or materials), the phase of reflected light is directly controlled through optical parameter changes rather than mechanical position changes, enabling compact integration while preserving spectral analysis functionality

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If a mechanical mirror movement structure is used to change the phase of reflected light, then the interferometer can achieve spectral analysis functionality, but the device size increases making it difficult to integrate into small electronic devices

Engineering Contradiction:
Improvespectral analysis capabilityVSAvoiddevice size
Core Design Contradiction:
Measurement precisionVSVolume of moving object

Solution Approach 1:

The patent eliminates the need for mechanical mirror movement by using a meta surface that modulates light phase through its sub-wavelength structures. This substitution removes the entire mechanical scanning mechanism and its associated space requirements, enabling the interferometer to be integrated into compact chip forms suitable for small electronic devices while maintaining spectral analysis capability

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent transitions from a one-dimensional mechanical scanning approach (moving mirrors along an axis) to a two-dimensional meta surface structure where phase modulation is achieved through variations in the geometric parameters of sub-wavelength elements in the plane. This dimensional change allows the same functional capability to be achieved in a much smaller volume

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables the manufacturing of a compact interferometer suitable for small devices like smartphones, allowing real-time analysis of light spectra without complex processing, reducing manufacturing costs and size constraints.

Implementation Method 1

a meta surface configured to locally and differently change a phase of the first light that is reflected

Methodology Applied
Scientific EffectPhase change: Phase Change

Implementation Method 2

detect an interference pattern between the remaining part of the third light and the first light of which the phase is locally and differently changed

Methodology Applied
Scientific EffectInterference: Interference

Data Source

PatentEP3486602B1Fourier-transform interferometer using meta surface
Publication Date: 2021.05.19 SAMSUNG ELECTRONICS CO LTD
  • EP3486602B1 patent drawingFigure 1~2
  • EP3486602B1 patent drawingFigure 3~4
  • EP3486602B1 patent drawingFigure 5~6

AI summary

A Fourier-transform interferometer includes a phase change plate including a reflective layer configured to reflect a first light that is incident, and a meta surface configured to locally and differently change a phase of the first light that is reflected. The Fourier-transform interferometer further includes a photodetector configured to detect a second light, and a transflective mirror and a mirror configured to transmit a first part of a third light that is incident, to the phase change plate, transmit a remaining part of the third light, to the photodetector, and transmit the first light of which the phase is locally and differently changed, to the photodetector. The photodetector is further configured to detect an interference pattern between the remaining part of the third light and the first light of which the phase is locally and differently changed.