Metal-Assisted Chemical Etching for Precise Substrate Recesses

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Bulk micromachining of substrates using dry etching processes is time-consuming, and wet etching often results in trenches with sloped sidewalls, which are not ideal for forming precise recesses or voids necessary for micro-electrical-mechanical systems (MEMS) devices and printheads.

Innovation Solution

A method involving sputtering a metal catalyst onto a substrate to form a discontinuous layer, followed by metal-assisted chemical etching using a solution of hydrogen peroxide, nitric acid, and hydrofluoric acid to create pores, which are then removed to form recesses, allowing for faster and more precise etching of substrates.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If dry etching processes are used for bulk micromachining, then etching can be performed on substrates, but the process is lengthy and produces trenches with sloped sidewalls

Engineering Contradiction:
Improvesidewall profile precisionVSAvoidetching speed
Core Design Contradiction:
Manufacturing precisionVSProductivity

Solution Approach 1:

The patent changes the etching parameters by using metal-assisted chemical etching with controlled metal catalyst deposition, varying etchant composition (nitric acid, hydrogen peroxide, hydrofluoric acid), and adjusting processing conditions to achieve both high etch rates (5 μm/min or greater) and vertical sidewall profiles, resolving the contradiction between speed and precision

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent introduces a metal catalyst layer as an intermediary between the substrate and the etching process. This metal layer mediates the chemical etching reaction, enabling anisotropic etching with vertical sidewalls while maintaining high etch rates, thus solving both the speed and precision issues simultaneously

Inventive Principle:
Principle #24Intermediary (Mediator)

2Productivity

If one-wafer-run dry etching is used, then substrate processing is simplified, but the etching process becomes lengthy

Engineering Contradiction:
Improveetching speedVSAvoidprocess duration
Core Design Contradiction:
ProductivityVSLoss of time

Solution Approach 1:

The metal-assisted chemical etching process achieves etch rates of 5 μm/min or greater, dramatically reducing process time compared to conventional dry etching. The parameter changes in etchant composition and metal catalyst properties enable this speed increase while maintaining batch processing efficiency

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The metal catalyst layer is deposited in advance before the etching process, creating a prepared substrate that etches rapidly and uniformly. This preliminary action enables the subsequent fast etching to proceed efficiently without requiring complex real-time process control, reducing overall process time

Inventive Principle:
Principle #10Preliminary action

3Manufacturing precision

If conventional etching methods are used, then simple processing is achieved, but precise recess formation is difficult

Engineering Contradiction:
Improverecess formation precisionVSAvoidprocess complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The metal catalyst is deposited with controlled local distribution and thickness variations, creating different etching rates in different regions of the substrate. This local quality control enables precise recess formation with vertical sidewalls and controlled dimensions, achieving high manufacturing precision

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The metal catalyst layer serves as a mediator that translates simple deposition and etching steps into complex precise recess structures. The intermediary metal layer enables controlled anisotropic etching, achieving precise geometry without requiring complex multi-step lithography and etching processes

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This method enables efficient and anisotropic etching of substrates, facilitating the formation of precise recesses and voids, such as trenches or holes, that are essential for MEMS devices and printheads, with etch rates exceeding 5 μm per minute and control over sidewall profiles.

Implementation Method 1

a method for etching a substrate may include sputtering a metal catalyst onto a substrate to form a discontinuous layer

Methodology Applied
Scientific EffectSputtering: Sputtering

Implementation Method 2

etching the substrate using a solution that reacts with the metal layer to form a plurality of pores in the substrate

Methodology Applied
Scientific EffectMetal-assisted chemical etching: Catalysis

Implementation Method 3

etching the substrate using a solution that reacts with the metal layer to form a plurality of pores in the substrate

Methodology Applied
Scientific EffectChemical reaction: Chemical Bonding

Data Source

PatentUS9988263B2Substrate etch
Publication Date: 2018.06.05 HEWLETT PACKARD DEVELOPMENT COMPANY LP
  • US9988263B2 patent drawing
  • US9988263B2 patent drawing
  • US9988263B2 patent drawing

AI summary

An example provides a method including sputtering a metal catalyst onto a substrate, exposing the substrate to a solution that reacts with the metal catalyst to form a plurality of pores in the substrate, and etching the substrate to remove the plurality of pores to form a recess in the substrate.