Semiconductor Package Metal Column Barrier for Sensor Air Exposure

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Conventional semiconductor packages cover sensors with mold compound, preventing exposure to ambient air, which is necessary for their functionality, such as humidity or dewpoint sensing.

Innovation Solution

Incorporating metal columns around the sensor on the semiconductor die to form a perimeter that acts as a mold barrier, allowing the sensor to be exposed to ambient air while being protected by the mold compound elsewhere.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If the semiconductor die is completely covered with mold compound for protection, then the structural integrity and environmental protection are improved, but the sensor cannot be exposed to ambient air for functionality

Engineering Contradiction:
Improvesensor functionalityVSAvoidprotection from environment
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The semiconductor die surface is segmented into two distinct regions: a first region containing the sensor that remains exposed to ambient air, and a second region that is covered by the mold compound for environmental protection. This segmentation allows the sensor to maintain its functionality while the rest of the die receives protective coverage.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different regions of the semiconductor die are given different properties: the first region (sensor area) has the quality of being exposed to ambient air for sensing functionality, while the second region has the quality of being protected by mold compound for environmental shielding. This local differentiation resolves the contradiction between exposure and protection.

Inventive Principle:
Principle #3Local quality

2Reliability

If metal columns are added to form a perimeter around the sensor, then the sensor exposure is improved, but the device complexity increases

Engineering Contradiction:
Improvesensor exposureVSAvoidstructure complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The metal columns serve multiple functions simultaneously: they form a perimeter boundary that defines the sensor exposure area, act as a barrier to prevent mold compound from covering the sensor, and provide structural support for the die. This multi-functionality reduces the need for separate components, thereby limiting the increase in device complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Exposes the sensor to ambient air for effective functionality while maintaining structural integrity and protection, enabling reliable humidity or dewpoint sensing.

Implementation Method 1

a set of metal columns on the surface of the semiconductor die, the set of metal columns forming a perimeter around the sensor on the surface of the semiconductor die

Methodology Applied
Scientific EffectPhysical barrier formation: Physical Containment

Implementation Method 2

soldering a set of metal columns on a surface of a semiconductor die to form a perimeter around a sensor on the surface of the semiconductor die

Methodology Applied
Scientific EffectSoldering: Soldering

Data Source

PatentUS20250289711A1Semiconductor package with metal column mold barrier
Publication Date: 2025.09.18 TEXAS INSTRUMENTS INC
  • US20250289711A1 patent drawing
  • US20250289711A1 patent drawing
  • US20250289711A1 patent drawing

AI summary

A semiconductor package includes a semiconductor die including terminals, a plurality of leads, at least some of the leads being electrically coupled to the terminals within the semiconductor package, a sensor on a surface of the semiconductor die, a set of metal columns on the surface of the semiconductor die, the set of metal columns forming a perimeter around the sensor on the surface of the semiconductor die, and a mold compound surrounding the semiconductor die except for an area inside the perimeter on the surface of the semiconductor die such that the sensor is exposed to ambient air.