Metal Fluoride Polymer Film for Fluorine Etch-Resistant Masks

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Solution Overview

Problem

The development of semiconductor devices with three-dimensional structures requires a mask pattern that exhibits high resistance to etching gases, particularly those containing fluorine, and enhances the etch rate of the processed substance.

Innovation Solution

A method for manufacturing a metal fluoride-containing organic polymer film by infiltrating an organic polymer film with an organometallic compound and exposing it to hydrogen fluoride, forming a metal fluoride layer that improves etch resistance and etch rate.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a conventional organic polymer film is used as a mask pattern, then the process is simple, but the resistance to etching gases containing fluorine is insufficient

Engineering Contradiction:
Improveetch resistanceVSAvoidmanufacturing process complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent creates a composite material by infiltrating an organic polymer film with metal atoms (such as aluminum) to form a metal-containing organic polymer film. This composite structure combines the etch resistance of metal fluorides with the processability of organic polymers, achieving high resistance to fluorine-containing etching gases while maintaining manufacturing feasibility through sequential infiltration and fluorination steps

Inventive Principle:
Principle #40Composite materials

Solution Approach 2:

The patent changes the chemical composition parameters of the organic polymer film by introducing metal atoms through infiltration with organometallic compounds, then further modifying it through fluorination to create metal fluoride species. This parameter transformation from pure organic polymer to metal-fluorinated composite significantly enhances etch resistance without requiring complete process redesign

Inventive Principle:
Principle #35Parameter changes

2Productivity

If the mask pattern is exposed to etching gas for extended period to achieve high aspect ratio, then the etch rate of processed substance increases, but the mask pattern durability decreases

Engineering Contradiction:
Improveetch rateVSAvoidmask pattern durability
Core Design Contradiction:
ProductivityVSDuration of action of stationary object

Solution Approach 1:

The metal-containing organic polymer film creates a composite protective layer where metal fluoride species (formed through fluorination of infiltrated metal atoms) provide exceptional resistance to fluorine-containing etching gases. This allows the mask to withstand extended exposure periods required for high aspect ratio patterning while maintaining structural integrity and protecting the underlying processed substance

Inventive Principle:
Principle #40Composite materials

Solution Approach 2:

The patent performs preliminary infiltration of metal atoms and subsequent fluorination treatment before the actual etching process. This pre-treatment creates a durable, etch-resistant mask structure that can withstand prolonged exposure to etching gases, enabling high aspect ratio features to be formed without mask degradation

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The resulting film demonstrates enhanced resistance to etching gases containing fluorine, allowing for precise patterning and increased etch rates, especially in high aspect ratio features.

Implementation Method 1

exposing the organic polymer film to an organometallic compound containing a first metal, thereby infiltrating the organic polymer film with the organometallic compound

Methodology Applied
Scientific EffectInfiltration: Absorption (physical)

Implementation Method 2

exposing the organic polymer film to an organometallic compound containing a first metal, thereby infiltrating the organic polymer film with the organometallic compound

Methodology Applied
Scientific EffectAdsorption: Adsorption

Implementation Method 3

exposing the organic polymer film infiltrated with the organometallic compound to hydrogen fluoride, thereby providing a fluoride of the first metal in the organic polymer film

Methodology Applied
Scientific EffectChemical reaction: Chemical Bonding

Data Source

PatentUS12424433B2Method for manufacturing metal fluoride-containing organic polymer film, patterning method, and method for manufacturing semiconductor device
Publication Date: 2025.09.23 KIOXIA CORP
  • US12424433B2 patent drawing
  • US12424433B2 patent drawing
  • US12424433B2 patent drawing

AI summary

A method for manufacturing a metal fluoride-containing organic polymer film includes forming an organic polymer film on a base body. The method includes exposing the organic polymer film to an organometallic compound containing a first metal, thereby infiltrating the organic polymer film with the organometallic compound. The method includes exposing the organic polymer film infiltrated with the organometallic compound to hydrogen fluoride, thereby providing a fluoride of the first metal in the organic polymer film.