Inspection Device for Metallic Surface Film Thickness Using L* Value
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Solution Overview
Problem
Conventional image inspection devices struggle to accurately determine the printed state of metallic surfaces due to varying color differences and film thickness, making it difficult to correctly assess the film thickness of ink on metal surfaces based on color differences between standard and inspection images.
Innovation Solution
An inspection device that acquires and analyzes image data using both regularly and irregularly reflected light to measure L* values in the L*a*b* colorimetric system, allowing for the determination of film thickness by calculating the difference value ΔL* between standard and inspection image data, and adjusts ink supply accordingly.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If color difference ΔE is used to inspect printed metallic surfaces, then inspection can be performed, but measurement precision deteriorates due to varying correlation between color difference and film thickness for different colors
Solution Approach 1:
The patent changes the inspection parameter from color difference ΔE to L* value in the L*a*b* colorimetric system. The L* value represents lightness and has a consistent correlation with film thickness across all colors, eliminating the color-dependent variability inherent in ΔE measurements. This parameter transformation enables precise film thickness measurement for all colors including white, which cannot be accurately measured using traditional color difference methods on metallic surfaces.
2Ease of manufacture
If traditional color difference inspection is used, then inspection process is simple, but manufacturing precision deteriorates due to inability to correctly determine film thickness
Solution Approach 1:
The patent transforms the inspection parameter from color difference ΔE to L* value, which maintains a consistent relationship with film thickness across all ink colors. This enables accurate film thickness determination and control while preserving the simplicity of the inspection process. The L* value measurement allows for precise manufacturing control of film thickness without complicating the inspection methodology.
3Adaptability or versatility
If color difference ΔE is measured for white ink, then inspection is performed, but measurement precision deteriorates because white color cannot correctly determine film thickness
Solution Approach 1:
The patent changes the measurement parameter from color difference ΔE to L* value (lightness component) in the L*a*b* colorimetric system. The L* value has a direct and consistent correlation with film thickness for white ink, whereas color difference ΔE cannot accurately determine white ink film thickness on metallic surfaces. This parameter transformation enables precise measurement of white ink film thickness, extending accurate inspection coverage to all colors including white.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate inspection and adjustment of ink film thickness on metallic surfaces, ensuring consistent printing quality by effectively correlating L* values with film thickness, even for colors like white where traditional methods fail.
Implementation Method 1
an imaging device configured to image an inspected object surface P1 to acquire inspection image data by receiving regularly and irregularly reflected light from the inspected object surface P1
Implementation Method 2
an imaging device configured to image an inspected object surface P1 to acquire inspection image data by receiving regularly and irregularly reflected light from the inspected object surface P1
Data Source
AI summary
There is provided an inspection device configured to inspect a printed state of an inspected object surface which is a printed metallic base. The inspection device includes: a processor; and a memory connected to the processor to be able to communicate with the processor, the processor being configured to: acquire inspection image data obtained by imaging the inspected object surface; measure an L* value for each of colors in an L*a*b* colorimetric system of the inspection image data; and inspect the printed state of the inspected object surface based on the L* value.