Metastability-Tolerant Signal Calibration Circuit for Compact TDCs

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Solution Overview

Problem

Conventional Time-to-Digital Converters (TDCs) require a large number of flip flops to synchronize samples, leading to significant chip area usage and power consumption, especially as clock periods decrease, due to the inherent metastability of flip flop circuits.

Innovation Solution

The proposed solution involves an independent metastability-tolerant circuit that uses two flip flops with a run clock signal and an XOR gate to detect changes in the output signals, allowing for metastability resolution without the need for multiple synchronizing flip flops, thereby reducing the number of flip flops required and minimizing chip area and power consumption.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional flip flops are used to synchronize TDC samples, then timing measurement reliability is improved, but chip area and power consumption increase significantly

Engineering Contradiction:
Improvetiming measurement reliabilityVSAvoidchip area
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The patent extracts the synchronization function from the traditional multi-stage flip-flop cascade and implements it using a single flip-flop with metastability resolution logic. The harmful aspect (excessive chip area) is removed by eliminating redundant flip-flops while preserving the essential synchronization capability through a different architectural approach.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent changes the operational parameters of the flip-flop system by allowing the flip-flop to enter and resolve metastable states rather than preventing them through cascaded stages. This parameter change (from avoiding metastability to resolving it) reduces the number of flip-flops needed from multiple stages to a single stage, significantly reducing chip area.

Inventive Principle:
Principle #35Parameter changes

2Reliability

If conventional flip flops are cascaded to resolve metastability, then synchronization reliability is improved, but power consumption increases

Engineering Contradiction:
Improvesynchronization reliabilityVSAvoidpower consumption
Core Design Contradiction:
ReliabilityVSUse of energy by stationary object

Solution Approach 1:

The patent removes the power-consuming cascaded flip-flop structure and replaces it with a single flip-flop配合 metastability resolution logic. This extraction of the synchronization function from the traditional multi-stage approach eliminates the excessive power consumption associated with clocking multiple flip-flops in sequence.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent changes the synchronization approach from preventing metastability (through multiple flip-flops) to resolving it (through a single flip-flop with resolution logic). This parameter change reduces power consumption by eliminating the need to clock multiple flip-flops while maintaining synchronization reliability.

Inventive Principle:
Principle #35Parameter changes

3Area of stationary object

If the number of flip flops is reduced, then chip area and power consumption decrease, but metastability resolution capability is compromised

Engineering Contradiction:
Improvechip areaVSAvoidmetastability resolution capability
Core Design Contradiction:
Area of stationary objectVSReliability

Solution Approach 1:

The patent introduces metastability resolution logic as an intermediary mechanism between the single flip-flop and the rest of the system. This intermediary logic detects and resolves metastable states, ensuring that the reduced flip-flop count does not compromise reliability. The intermediary compensates for the potential loss of robustness from using fewer flip-flops.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent replaces the mechanical cascade of multiple flip-flops with a different system architecture using a single flip-flop配合 detection and resolution logic. This substitution achieves the same functional goal (metastability resolution) with fewer physical components, reducing chip area while maintaining reliability through a different mechanism.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

4Productivity

If clock period is decreased to improve system performance, then productivity increases, but the number of flip flops needed for reliable synchronization increases

Engineering Contradiction:
Improvesystem performanceVSAvoidnumber of flip flops
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The patent changes the synchronization approach to be independent of clock period through the use of a single flip-flop with metastability resolution logic. This parameter change allows the system to maintain constant synchronization complexity regardless of clock period, enabling high-performance operation without increasing the number of flip-flops even as clock periods decrease.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS11133794B1Signal calibration circuit
Publication Date: 2021.09.28 NVIDIA CORP
  • US11133794B1 patent drawing
  • US11133794B1 patent drawing
  • US11133794B1 patent drawing

AI summary

This disclosure relates to a circuit comprising a first, second, and third data latch, and an input for a data signal. The first data latch may be configured to sample a delayed version of the data signal in response to a first control signal. The second data latch may be configured to sample the delayed version of the data signal in response to a run clock signal. The run clock signal may be configured to run for a predefined number of clock cycles subsequent to the first control signal. The third data latch may be configured to sample either an output signal of the first data latch or an output signal of the second data latch in response to a second control signal received after the predefined number of clock cycles of the run clock signal.