Metasurface Filter for Radiation Detector Wavelength Selection

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Solution Overview

Problem

Existing radiation detectors face challenges in selectively detecting light of interest across different wavelength regions and emission peak shapes due to the limitations of resin films used as light selection layers, which struggle to effectively block or transmit light in the ultraviolet region and manage multiple emission peaks.

Innovation Solution

A radiation detector is designed with a metasurface filter layer instead of a resin film, featuring columnar metal structures that selectively block or transmit scintillation light based on its peak wavelength and decay time, improving filter performance and allowing for the detection of light of interest regardless of wavelength region and emission peak shape.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If a resin film is used as the light selection layer, then the structure is simple and easy to manufacture, but it is difficult to adjust light in the ultraviolet region and selectively transmit or block light with specific wavelengths

Engineering Contradiction:
Improveease of manufactureVSAvoidadaptability to wavelength region
Core Design Contradiction:
Ease of manufactureVSAdaptability or versatility

Solution Approach 1:

The patent changes the material parameter from conventional resin films to metasurface materials with specific geometric structures. By adjusting the shape, size, and arrangement parameters of the metasurface units, the filter can selectively transmit or block light across different wavelength regions including ultraviolet, visible, and infrared bands, thereby achieving wavelength-region adaptability while maintaining manufacturability through standard fabrication processes

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent employs composite structures combining metasurface geometric patterns with substrate materials. This composite approach enables the filter layer to achieve multiple optical functions (transmission, reflection, absorption) at different wavelengths simultaneously, overcoming the limitations of single-material resin films and enabling selective light manipulation across broad spectral ranges

Inventive Principle:
Principle #40Composite materials

2Ease of manufacture

If a resin film is used as the light selection layer, then the manufacturing process is simple, but it is difficult to selectively transmit light when there are two emission peaks with different peak wavelengths

Engineering Contradiction:
Improveease of manufactureVSAvoidfiltering precision
Core Design Contradiction:
Ease of manufactureVSManufacturing precision

Solution Approach 1:

The patent applies local quality by designing different metasurface unit structures at different locations or regions of the filter layer. Each local region can be optimized to handle specific wavelength ranges or emission peaks, enabling precise selective transmission for multi-peak scintillation light while maintaining overall manufacturing simplicity through standardized unit cell replication

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent segments the filter layer into multiple functional regions or layers, each responsible for filtering specific wavelength bands. This segmentation allows independent optimization of each segment for different emission peaks, achieving high filtering precision for complex spectral distributions while keeping each segment's manufacturing process simple and modular

Inventive Principle:
Principle #1Segmentation

3Measurement precision

If a metasurface structure is used for the filter layer, then light of interest can be suitably transmitted and unwanted light blocked regardless of wavelength region and emission peak shape, but the structure becomes more complex

Engineering Contradiction:
Improvedetection precisionVSAvoidstructure complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent introduces dynamic adjustability in the metasurface structure, allowing the filter characteristics to be tuned or reconfigured based on detection requirements. This dynamic capability enables the same filter structure to adapt to different wavelength regions and emission peak shapes, achieving high detection precision while reducing the need for multiple fixed-configuration filters

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent designs the metasurface filter layer with universal functionality that can handle multiple wavelength regions (ultraviolet, visible, infrared) and various emission peak shapes using a single integrated structure. This multi-functional design achieves high detection precision across diverse conditions while avoiding the complexity of multiple specialized filter components

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The metasurface filter layer enhances the detection of light with a specific wavelength of interest by effectively blocking unwanted light, improving time resolution and detection accuracy by selectively transmitting shorter decay-time scintillation light, while reducing interference from longer decay-time light.

Implementation Method 1

A radiation detector having a scintillator that converts radiation such as X-rays into light

Methodology Applied
Scientific EffectScintillation: Scintillation

Implementation Method 2

the filter layer has a metasurface structure... configured to selectively block the first scintillation light

Methodology Applied
Scientific EffectMetasurface filtering: Filter (optical)

Implementation Method 3

a photodetector that detects the light converted by the scintillator

Methodology Applied
Scientific EffectPhotoelectric detection: Photoelectric Effect

Data Source

PatentUS12153172B2Radiation detector and radiation detection device
Publication Date: 2024.11.26 HAMAMATSU PHOTONICS KK
  • US12153172B2 patent drawing
  • US12153172B2 patent drawing
  • US12153172B2 patent drawing

AI summary

A radiation detector of one embodiment includes: a scintillator configured to generate first scintillation light having a first peak wavelength and second scintillation light having a second peak wavelength in response to radiation incidence; a photodetection unit configured to detect the scintillation light generated by the scintillator; and a filter layer disposed between the scintillator and the photodetection unit and configured to selectively block the first scintillation light. The filter layer has a metasurface structure.