Correlating Method Parameter and Event Traces for Distributed Server Profiling

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Solution Overview

Problem

In distributed application server environments, performance and scalability issues arise due to concurrent user access, and existing profiling tools lack comprehensive insights into resource consumption and method-level analysis.

Innovation Solution

The method involves generating method parameter traces and event traces, such as allocation traces, to combine profiling data, providing detailed insights into method performance and resource usage by correlating parameter values with events and thread activities.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If multiple concurrent users access servers and applications in a distributed environment, then user accessibility and service availability are improved, but performance and scalability problems arise due to increased resource consumption

Engineering Contradiction:
Improveuser accessibilityVSAvoidperformance and scalability
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent implements performance monitoring and profiling tools that continuously collect runtime data about resource consumption, method calls, and event occurrences. The system analyzes this feedback data to identify performance bottlenecks and scalability issues, enabling iterative optimization of the application to maintain reliability under increased concurrent user load

Inventive Principle:
Principle #23Feedback

2Measurement precision

If existing profiling tools are used to monitor resource consumption, then some performance insights are obtained, but comprehensive method-level analysis and detailed event correlation are insufficient

Engineering Contradiction:
Improveperformance insightsVSAvoidmethod-level analysis and event correlation
Core Design Contradiction:
Measurement precisionVSLoss of information

Solution Approach 1:

The patent segments the profiling data into distinct traces: method parameter traces capturing method call details, event traces capturing system events, and allocation traces capturing memory operations. Each trace is independently collected and then correlated through a combination process that links them by timestamp and thread identifier, preserving comprehensive method-level analysis and event correlation information

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent adds temporal and contextual dimensions to the profiling data by correlating multiple traces through timestamp and thread identifier. This dimensional expansion transforms isolated data points into interconnected sequences, enabling detailed analysis of method execution flow and event relationships that were previously lost in conventional profiling approaches

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Data Source

PatentUS8527960B2Combining method parameter traces with other traces
Publication Date: 2013.09.03 SAP SE
  • US8527960B2 patent drawing
  • US8527960B2 patent drawing
  • US8527960B2 patent drawing

AI summary

Implementations of the present disclosure provide methods including executing an application, generating a method parameter trace, the method parameter trace providing one or more parameter values corresponding to one or more methods called during execution of the application, generating an event trace, the event trace identifying one or more events occurring during execution of the application, and combining the method parameter trace and the event trace to provide a profile of events occurring during each of the one or more methods based on the one or more parameter values.