Metric Model Combination for Plant System Abnormality Detection

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Solution Overview

Problem

In plant systems, the timing at which metric relations change varies across different pairs and even within the same state, leading to errors in correlation models used for monitoring, making it difficult to accurately detect system abnormalities.

Innovation Solution

An information processing apparatus that stores models for each metric set and determines system states by comparing combinations of models conforming to specific states, allowing for accurate monitoring even when relation changes occur differently across metrics.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a correlation model is generated for each period associated with a state of the system, then the system can detect abnormalities by comparing metric values to the correlation model, but the correlation model becomes inaccurate when the timing of relation changes differs across metric pairs

Engineering Contradiction:
Improveabnormality detection accuracyVSAvoidcorrelation model accuracy
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The patent segments the correlation model into multiple metric-specific correlation models, each tailored to the specific timing characteristics of its metric pair. Instead of using a single unified correlation model for all metrics, the system generates individual correlation models for each metric pair, allowing each to accurately reflect its unique temporal relationship patterns without being constrained by other metrics' timing variations.

Inventive Principle:
Principle #1Segmentation

2Device complexity

If a single correlation model is used for all metric pairs, then the system structure remains simple, but the model cannot accurately represent different timing characteristics of various metric pairs

Engineering Contradiction:
Improvecorrelation model structureVSAvoidrelation representation accuracy
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent applies local quality by making each correlation model specific to its metric pair's local characteristics. Each metric pair receives a customized correlation model that reflects its unique temporal relationship patterns, rather than forcing all metrics to conform to a single global model structure. This localized approach ensures that each metric pair's specific timing characteristics are accurately captured.

Inventive Principle:
Principle #3Local quality

Data Source

PatentUS10733331B2Information processing apparatus, information processing method, and recording medium
Publication Date: 2020.08.04 NEC CORP
  • US10733331B2 patent drawing
  • US10733331B2 patent drawing
  • US10733331B2 patent drawing

AI summary

Monitoring of a state of a system can be accurately performed even when a timing at which a relation changes is different for each set of the metrics. A monitoring apparatus 100 includes a model storage unit 122 and a determination unit 115. The model storage unit 122 stores, for each of a plurality of metric sets in a system, a model representing a relation among metrics included in the corresponding metric set. The determination unit 115 determines and outputs whether the system is in one state, by comparing a combination of models to which the plurality of metric sets conform respectively when the system is in the one state and a combination of models to which the plurality of metric sets conform respectively when the system is in a state to be determined.