Metrology System for Telescope Primary Mirror Elevation Axis
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Solution Overview
Problem
Conventional metrology systems for measuring displacement in telescope apparatus rely solely on detecting movement of the yoke portion to estimate the orientation direction of the primary mirror, lacking a method to measure displacement of the elevation axis.
Innovation Solution
A metrology system that includes an elevation axis base portion and an inclinometer positioned along the elevation axis to measure the inclination angle, allowing for the measurement of displacement of the elevation axis and enabling accurate orientation direction estimation of the primary mirror.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional metrology systems use only yoke portion movement detection to estimate primary mirror orientation, then the system structure remains simple, but the measurement precision of elevation axis displacement is insufficient
Solution Approach 1:
The patent introduces an elevation axis base portion as an intermediary component that connects the elevation axis to the azimuth mount. This base portion serves as a mediator to transmit and measure displacement accurately, enabling precise elevation axis measurement without directly complicating the entire metrology system structure.
Solution Approach 2:
The patent segments the metrology measurement function into distinct components: the elevation axis base portion for elevation measurement and the azimuth axis base portion for azimuth measurement. This segmentation allows each component to be optimized for its specific measurement function, improving overall precision while maintaining manageable system complexity.
2Measurement precision
If no inclinometer is installed on the elevation axis base portion, then the device complexity is lower, but the ability to measure elevation axis displacement accurately is lost
Solution Approach 1:
The elevation axis base portion is designed to inherently support the inclinometer through its own structural features, allowing the measurement function to be integrated into the component itself. The base portion's geometry and mounting structure enable the inclinometer to be installed and operated without requiring additional external support structures.
3Measurement precision
If the elevation axis and azimuth axis intersection position is not precisely defined, then the system setup is simpler, but the measurement accuracy of displacement at the intersection point deteriorates
Solution Approach 1:
The patent performs preliminary positioning and definition of the elevation axis and azimuth axis intersection point during the manufacturing and assembly phases. By pre-establishing the precise intersection position and defining the coordinate system at this point, the measurement accuracy is ensured from the outset, and the complexity of achieving this precision is managed during the manufacturing process rather than during operation.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables precise measurement of displacement along the elevation axis, improving the accuracy of primary mirror orientation direction estimation and correcting orientation errors in telescope apparatus.
Implementation Method 1
an inclinometer disposed at a position of the elevation axis base portion through which the azimuth axis passes, and to measure an inclination angle of the elevation axis base portion
Data Source
AI summary
A metrology system measures an amount of displacement of a structure of apparatus including primary mirror, the apparatus including primary mirror including a primary mirror portion including a primary mirror and a primary mirror supporting portion, an elevation axis structural body supporting the primary mirror portion, and being rotatable around an elevation axis, an azimuth mount being rotatable around an azimuth axis allowing an azimuth angle in the orientation direction to be changed, and to support the elevation axis structural body, and a pedestal portion supporting the azimuth mount, and the metrology system includes an elevation axis base portion provided along the elevation axis, passing through a position where the elevation axis and the azimuth axis intersect, and being fixed to the azimuth mount, and an inclinometer that is disposed at a position of the elevation axis base portion through which the azimuth axis passes and measures an inclination angle.