Metrology-Guided Workpiece Production With Feedback Control
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Solution Overview
Problem
Industrial manufacturing processes face challenges in efficiently producing workpieces with high quality, especially in large and small batch sizes, due to complex causes and effects leading to production errors, and the difficulty in identifying these causes effectively.
Innovation Solution
A method and manufacturing installation that utilize a metrology device to determine actual workpiece characteristics, compare them to desired characteristics, and adjust control commands based on deviations, allowing for efficient production by exploiting knowledge gained during previous production runs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If metrology devices are integrated into manufacturing installations for real-time quality monitoring, then manufacturing precision and productivity are improved, but device complexity increases
Solution Approach 1:
The patent combines the manufacturing machine and metrology device into an integrated manufacturing installation where the metrology device is directly coupled to the manufacturing machine. This merging allows real-time measurement of workpiece characteristics during manufacturing without requiring separate measurement processes, thereby improving manufacturing precision while managing device complexity through functional integration.
Solution Approach 2:
The system implements a feedback mechanism where the metrology device measures actual workpiece characteristics and compares them with desired characteristics. The control device receives this comparison data and generates adjusted control commands to compensate for deviations, creating a closed-loop control system that continuously improves manufacturing precision through real-time feedback.
2Manufacturing precision
If remote measuring rooms are used for quality control, then manufacturing precision is improved, but loss of time increases due to measurement delays
Solution Approach 1:
The metrology device is positioned to perform measurements during or immediately after the manufacturing process, rather than after completion and transport to a remote facility. This preliminary action approach allows measurements to be taken while the workpiece is still in the manufacturing installation, significantly reducing the time-to-result while maintaining measurement accuracy.
Solution Approach 2:
The control device acts as an intermediary that receives measurement data from the metrology device and translates it into adjusted control commands for the manufacturing machine. This intermediary function enables real-time data processing and command generation, eliminating the time delays associated with remote measuring rooms while preserving measurement precision.
3Manufacturing precision
If dedicated measuring room infrastructure is established, then manufacturing precision is improved, but loss of energy and cost increase
Solution Approach 1:
The manufacturing installation performs multiple functions: it manufactures workpieces using the manufacturing machine and simultaneously measures workpiece characteristics using the integrated metrology device. This multi-functionality eliminates the need for separate dedicated measuring room infrastructure, reducing energy consumption and costs while maintaining manufacturing precision through integrated real-time measurement capabilities.
Data Source
AI summary
A method for producing workpieces using a manufacturing installation includes obtaining a data set defining desired workpiece characteristics of workpieces. The method includes producing a first workpiece in first successive manufacturing steps using a first manufacturing machine. The method includes repeatedly recording first process parameters during the first successive manufacturing steps. The method includes mapping the first process parameter sequences onto the first successive manufacturing steps to obtain first sequential mapping data. The method includes inspecting the first workpiece using a metrology device to obtain actual first workpiece characteristics. The method includes comparing the actual first workpiece characteristics with the desired workpiece characteristics to determine deviations. The method includes determining second control commands based on the deviations, at least one of the first control commands and the data set, and the first sequential mapping data. The method includes producing a second workpiece using the second control commands.