Metrology Test Plan Pattern Adaptation for Large Geometry Sets
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Solution Overview
Problem
Current methods for producing test plans in coordinate metrology are labor-intensive and prone to errors, especially when dealing with a large number of geometric elements, as they require manual handling and deletion of unneeded division positions, making the process complex and time-consuming.
Innovation Solution
A computer-implemented method that automatically produces test plans by comparing a desired dataset with a starting pattern, adapting division indices, and creating a target pattern to exclude unneeded elements, thereby eliminating the need for manual intervention and reducing errors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If geometric elements are produced individually in the test plan, then each element can be measured precisely, but the time and labor required to create the test plan increases significantly
Solution Approach 1:
The patent segments the test plan creation process by introducing pattern-based grouping of geometric elements. Instead of handling each element individually, elements are organized into patterns that can be defined collectively, reducing the time required while maintaining individual element measurement capability through pattern positions and indices
Solution Approach 2:
The patent applies preliminary action by pre-defining patterns and their positions before actual measurement. The pattern definition phase separates the complex task of individual element configuration from the measurement execution, allowing for more efficient test plan production while preserving measurement precision
2Loss of time
If patterns are used to define geometric elements collectively, then the time and labor for producing the test plan is reduced, but manual handling and deletion of unneeded division positions becomes complex and error-prone
Solution Approach 1:
The patent implements feedback mechanisms where the system automatically compares the generated pattern against the desired dataset and identifies deviations. This feedback loop enables automatic adaptation of division indices, eliminating manual deletion operations and their associated errors while maintaining the efficiency benefits of pattern-based definition
Solution Approach 2:
The system performs self-service by automatically adapting patterns to match the desired dataset without requiring manual intervention. The automatic comparison and adaptation processes handle the configuration of division indices independently, reducing both time consumption and error susceptibility
3Quantity of substance
If a very large number of geometric elements are used, then comprehensive measurement coverage is achieved, but manual handling of patterns becomes unmanageable and time-consuming
Solution Approach 1:
The patent replaces manual mechanical operations with automated computational processes. Instead of manually configuring and managing patterns for thousands of geometric elements, the system uses automatic comparison algorithms and adaptive generation processes that can handle large quantities of elements efficiently and without error
Data Source
AI summary
A computer-implemented method automatically produces a test plan for measuring a measured object. The method includes obtaining a desired dataset of the measured object. The method includes providing a starting pattern. The providing comprises producing a division. The producing the division comprises applying at least one division function. The division has a plurality of division indices. The method includes producing a target pattern by generating a comparison between the desired dataset and the division. At least one division index is adapted in response to a deviation of the division from the desired dataset. The method includes creating at least one element with at least one piece of pattern information in the test plan in accordance with the target pattern.