Micro-Camera Array Microscope for Stageless Large-Field Inspection
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Solution Overview
Problem
Current optical inspection systems face challenges in achieving high resolution and large field of view without requiring costly and complex motion subsystems, which limits their ability to inspect large or non-planar objects efficiently.
Innovation Solution
The implementation of a micro-camera array microscope (MCAM) technology, which consists of multiple digital image sensors and associated lenses that can capture high-resolution images over a large field of view without the need for mechanical scanning, using refocusing strategies to ensure in-focus imaging across non-planar surfaces.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a single camera is used to achieve high resolution, then measurement precision is improved, but the field of view is limited and cannot cover large objects
Solution Approach 1:
The patent divides a single large camera system into multiple smaller micro-camera units arranged in an array. Each micro-camera captures a portion of the overall scene, and when combined, these segments form a complete high-resolution image of a large field of view, effectively resolving the contradiction between resolution and field of view coverage
2Area of stationary object
If mechanical scanning systems are used to image large objects, then field of view is improved, but device complexity and cost increase
Solution Approach 1:
The patent replaces mechanical scanning systems with a static micro-camera array that captures the entire field of view simultaneously. This eliminates the need for complex motion subsystems, stages, and scanning mechanisms, thereby reducing device complexity and cost while maintaining large field of view capability
3Area of stationary object
If mechanical scanning is used to achieve large field of view, then area coverage is improved, but productivity decreases due to sequential imaging
Solution Approach 1:
The patent enables simultaneous capture of the entire field of view using a micro-camera array, eliminating the sequential nature of mechanical scanning. This continuous parallel imaging approach dramatically improves productivity and throughput by capturing all areas of interest at the same time rather than sequentially
4Device complexity
If a single camera system is used, then device complexity is reduced, but the ability to image non-planar surfaces is limited
Solution Approach 1:
The patent assigns different focal lengths to different micro-camera units in the array, with each camera optimized for its specific region of the non-planar surface. This local optimization allows the system to maintain focus across varying depths and surface geometries while keeping the overall system relatively simple
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables the creation of a stageless inspection system that can image large objects at high resolution in a single snapshot, reducing costs, increasing throughput, and minimizing the size and weight of the inspection tool, while also providing 2D and 3D imaging capabilities.
Implementation Method 1
The ability to detect these defects using non-destructive electromagnetic radiation ensures that the inspection can be done throughout the manufacturing process
Implementation Method 2
The illumination system uses quick pulses of light to provide a 'freeze frame' of the product being inspected. The use of 'freeze frame' is performed to reduce blur from movement
Data Source
AI summary
An arrangement of one or more micro cameras are used in conjunction with computer controlled illumination to create a high-throughput microscope able to operate without the need of expensive scanning stages. A single unit contains a plurality of sensors, lenses tiled in such a way to cover a significant fraction of the desired field of view in a digital single acquisition. Mechanical stages and patterned illumination can then be used in conjunction with the system to enhanced the imaged depth of field, or create an acquisition stack to enhance the information acquired. Multiple units can be combined to obtain images of a single sample from different angles. The absence of mechanical stages makes the imaging system ideal for use in scenarios that require the sample to be in a climate and/or environmentally controlled chamber.