Micro DUT Carrier Locking Mechanism for Probe Retrieval
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional micro DUT carriers face issues with micro DUTs being dislocated and dropped during probe retrieval due to inadequate positioning and structural limitations, leading to inaccurate placement and potential damage.
Innovation Solution
A micro DUT carrier design featuring a carrier main body with separate bearing stages, a pusher, and a spring, which allows controlled movement of the pusher between locking and opening positions, utilizing locking elements and restraint planes to securely position and restrain micro DUTs, enhancing positioning accuracy and preventing dropping during probe retrieval.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If probes are used to electrically connect and retrieve micro DUTs, then electrical testing can be performed, but micro DUTs may be dislocated or dropped during probe retrieval
Solution Approach 1:
The locking elements are positioned in advance within the bearing stages to engage with the micro DUTs before probe retrieval occurs. This preliminary positioning action prevents dislocation during the subsequent probe retrieval operation, resolving the contradiction between maintaining positioning stability and enabling easy probe retrieval.
Solution Approach 2:
The locking elements act as an intermediary mechanism between the micro DUTs and the bearing stages. During probe retrieval, the locking elements engage with the micro DUTs to prevent dropping, while allowing the probes to freely connect and disconnect. This intermediary structure resolves the conflict between operational ease and positioning reliability.
2Manufacturing precision
If micro DUTs are held in fixed bearing cavities, then positioning accuracy is maintained, but micro DUTs cannot be easily retrieved or replaced
Solution Approach 1:
The bearing stages are designed with movable locking elements that can transition between locked and unlocked states. When locked, the micro DUTs are precisely positioned; when unlocked, the micro DUTs can be easily retrieved. This dynamic design resolves the contradiction between maintaining positioning accuracy and enabling easy retrieval by allowing the system to switch between these two states as needed.
Solution Approach 2:
The carrier is divided into multiple independent bearing stages, each with its own locking mechanism. This segmentation allows individual micro DUTs to be retrieved or replaced without affecting others, maintaining positioning accuracy for each while enabling selective retrieval operations. The modular structure resolves the contradiction between fixed positioning and easy replacement.
3Productivity
If multiple micro DUTs are tested simultaneously, then testing efficiency is improved, but positioning accuracy for each individual micro DUT becomes more difficult to maintain
Solution Approach 1:
The carrier main body is divided into multiple separate bearing stages, with each stage independently holding one micro DUT. This segmentation allows multiple micro DUTs to be tested simultaneously while maintaining individual positioning accuracy for each. The independent locking elements on each bearing stage ensure that positioning precision is preserved even when multiple devices are tested in parallel, resolving the contradiction between testing efficiency and positioning accuracy.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution effectively prevents micro DUTs from being dropped during probe retrieval and improves positioning accuracy by providing directional limitations, ensuring reliable and precise placement for testing, while also incorporating vacuum holes for auxiliary support.
Implementation Method 1
the spring provides elastic resilience to send the pusher back to the locking position
Implementation Method 2
vacuum holes for vacuuming thereon the micro DUTs
Data Source
AI summary
A micro device under test (DUT) carrier includes a carrier main body, a pusher and a spring. The carrier main body includes a plurality of bearing stages. Each bearing stage is utilized to bear a micro DUT. The pusher, operated to move from a locking position to an opening position, includes a pusher main body and a plurality of locking elements. Each locking element corresponds to each bearing stage, and is located next to each bearing stage. The spring is utilized to send the pusher back to the locking position, so that each locking element restricts movement of each micro DUT.


