μIC Array Current Scanning for Abnormality Isolation

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Solution Overview

Problem

Existing detection systems for micro-integrated circuits (μICs) in μLED applications fail to distinguish between abnormalities in μICs and μLEDs during the mass transfer process, leading to inefficiencies in identifying and addressing issues.

Innovation Solution

A detection method and system that scans μICs in columns and rows, measuring total and sub-pixel currents to identify abnormalities by comparing against preset currents, and utilizing switch circuits and analog-to-digital converters to pinpoint defective μICs through sequential scanning and partitional analysis.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If μICs and μLEDs are transferred through mass transfer technology, then productivity is improved, but the ability to distinguish abnormalities between μICs and μLEDs deteriorates

Engineering Contradiction:

Improvemass transfer efficiencyVSAvoidabnormality source identification accuracy

Core Design Contradiction:

ProductivityVSMeasurement precision

Solution Approach 1:

The patent divides the detection process into two distinct stages: first detecting μICs before mass transfer, then detecting μLEDs after transfer. This segmentation allows each component to be detected independently, solving the problem of being unable to distinguish abnormality sources while maintaining mass transfer productivity. The detection system separates the detection functions for μICs and μLEDs into different operational phases.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The patent performs preliminary detection of μICs before they undergo mass transfer to the target substrate. By detecting μIC abnormalities in advance, the system establishes a baseline of component quality before mixing different components together, enabling precise identification of whether subsequent abnormalities originate from μICs or μLEDs.

Inventive Principle:

Principle #10Preliminary action

2Measurement precision

If sequential scanning and partitional analysis are implemented, then measurement precision is improved, but device complexity increases

Engineering Contradiction:

Improveabnormal μIC identification accuracyVSAvoiddetection system complexity

Core Design Contradiction:

Measurement precisionVSDevice complexity

Solution Approach 1:

The detection system divides the μIC array into multiple columns and scans them sequentially, rather than detecting all μICs simultaneously. This segmentation of the detection process reduces the complexity of the detection circuitry needed at any one time while maintaining high measurement precision through systematic column-by-column analysis.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The patent employs periodic scanning of μIC columns in sequence, activating detection for one column at a time in a repeating cycle. This periodic action allows the use of simpler detection circuits that are reused across multiple columns, reducing overall device complexity while achieving precise identification of abnormal μICs through repeated measurement cycles.

Inventive Principle:

Principle #19Periodic action

Data Source

PatentUS20250306087A1Micro-integrated circuit detection system and detection method thereof

Publication Date: 2025.10.02 AU OPTRONICS CORP

AI summary

A micro-integrated circuit (μIC) detection method is applicable for detecting a plurality of μICs on a panel. The μIC detection method includes: turning on the μICs arranged in columns and rows on the panel; scanning the μICs in each of the rows in sequence to obtain a total current of the μICs in each of the rows; and determining at least one of the μICs in one of the rows to be abnormal when the total current of the μICs in the one of the rows does not match a preset total current.