Micro LED Contact Edge Spacing for Leakage Prevention
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Solution Overview
Problem
Mini and micro light-emitting diodes face issues with uneven current spreading and current leakage due to defects in sidewalls, leading to reduced luminous efficiency.
Innovation Solution
A display device design with a light-emitting unit featuring a transporting layer and a conductive layer where the distance between the edge of the contact region and the edge of the transporting layer is greater than or equal to 0.1 μm, along with a current blocking layer on the side surfaces to prevent electron capture and leakage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If the contact region edge is positioned close to the transporting layer edge to maximize current conduction path, then current spreading efficiency improves, but current leakage through sidewall defects increases
Solution Approach 1:
An insulating layer is introduced as an intermediary between the contact region and the transporting layer sidewall. This insulating layer acts as a mediator that prevents direct electrical contact between the conductive contact region and the defective sidewall, thereby blocking current leakage paths while allowing the contact region to extend close to the transporting layer edge for optimal current spreading
Solution Approach 2:
The harmful factor (sidewall defects) is isolated from the current conduction path by extracting the sidewall region from the electrical pathway. The insulating layer effectively removes the defective sidewall from the current flow, preventing electron capture at sidewall defects while maintaining the intended current spreading through the transporting layer
2Loss of energy
If the contact region extends to the edge of the transporting layer to improve current distribution, then luminous efficiency improves, but short circuit risk increases
Solution Approach 1:
The insulating layer serves as a protective intermediary that allows the contact region to extend to or near the transporting layer edge for optimal current distribution and luminous efficiency, while simultaneously preventing short circuits by electrically isolating the conductive contact region from the sidewall structures
3Productivity
If the sidewall is left exposed to allow current conduction, then current flow through the light-emitting area improves, but electron capture at defects increases
Solution Approach 1:
The potentially harmful sidewall structure is converted into a beneficial configuration by coating it with an insulating layer. This transformation turns the sidewall from a source of electron capture defects into a protected boundary that guides current flow through the intended path while preventing harmful electron capture
Solution Approach 2:
The insulating layer acts as a mediator between the current-carrying contact region and the sidewall structure, allowing the sidewall to maintain its structural role while preventing its defective surface from capturing electrons and creating leakage paths
Data Source
AI summary
A display device is provided. The display device includes a substrate and a light-emitting unit disposed on the substrate. The light-emitting unit includes a transporting layer having a first semiconductor region and a second semiconductor region, and a conductive layer having a contact region that is in contact with the second semiconductor region. The distance between an edge of the contact region and an edge of the transporting layer is greater than or equal to 0.1 μm.


