Micro LED Test Contact Structure for Narrow-Pitch Electrodes
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Solution Overview
Problem
Existing test devices are inadequate for reliably testing micro LEDs with electrodes having sizes and pitch distances ranging from 1 to 100 micrometers, as they fail to accommodate the precise dimensions and pitch required for these components.
Innovation Solution
A test device comprising an insulation member with a conductive part that includes a wiring part inside and a connection part outside, where the conductive part is integrated with the insulation member and features a thickness equal to or less than the insulation member, and includes elastic parts to ensure precise contact with electrodes, allowing for testing of micro LEDs with narrow pitch distances.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional test devices are used, then general testing capability is maintained, but testing reliability for micro LEDs with small electrode sizes and pitch distances deteriorates
Solution Approach 1:
The patent changes the dimensional parameters of the contact pin, reducing its size and pitch to match the micro LED electrode specifications (10 μm size and pitch). This parameter adjustment enables the test device to reliably test micro LEDs with small electrode sizes and pitch distances that conventional devices cannot accommodate
Solution Approach 2:
The contact pin is designed with elastic properties, allowing it to dynamically adapt to the micro LED electrode surface. The elastic deformation capability enables precise contact while accommodating manufacturing tolerances and surface variations, thereby improving testing reliability
2Manufacturing precision
If contact pin size is reduced to match micro LED electrodes, then contact precision is improved, but structural strength deteriorates
Solution Approach 1:
The contact pin is designed as a flexible elastic structure rather than a rigid component. This flexible design allows the pin to maintain structural integrity while accommodating the reduced size requirements, preventing breakage during handling and testing operations
Solution Approach 2:
The elastic properties of the contact pin enable it to dynamically deform under load, distributing stress throughout the structure. This dynamic response prevents localized stress concentration that would cause failure in a rigid, miniaturized pin
3Measurement precision
If contact pin pitch is reduced to match micro LED electrodes, then measurement precision is improved, but position error increases
Solution Approach 1:
The elastic contact pin can dynamically adjust its position through elastic deformation, compensating for misalignment and position errors. This dynamic adjustment capability ensures reliable contact with the micro LED electrodes even when pitch variations occur
Solution Approach 2:
The elastic design provides a cushioning effect that absorbs position errors and manufacturing tolerances before they can cause testing failures. The elastic deformation acts as a buffer, maintaining contact reliability despite variations in electrode positioning
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The test device enables reliable testing of micro LEDs by minimizing position errors and accommodating narrow pitch distances, ensuring effective electrical contact and reducing thermal deformation, thus improving testing accuracy and efficiency.
Implementation Method 1
an elastic part elastically connecting the base end part and the tip end part to each other, thereby displacing the tip end part
Implementation Method 2
the insulation member may be an anodic oxide film in which a base metal is anodized and then the base metal is removed
Data Source
AI summary
Proposed are a test device and a manufacturing method of the test device capable of testing a test object that is provided with an electrode which has a size and/or a pitch distance ranging from 1 to 100 micrometers (μm).