Micro-LED Inspection Substrate for Defect Repair After Transfer
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Solution Overview
Problem
Micro-LED display devices face challenges in repairing defective light-emitting elements due to defects in the micro-LEDs themselves or failures during the transfer process, leading to increased manufacturing costs from redundant light-emitting elements.
Innovation Solution
A method for repairing and inspecting display devices involves transferring light-emitting elements onto a panel substrate, using an inspection substrate with contact pins to determine defective elements and replacing them with normal ones, thereby omitting redundant elements and reducing production costs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Shape
If micro-LED display devices use separate substrate transfer process, then device flexibility and thinning are improved, but defect rate increases due to transfer process failures
Solution Approach 1:
The patent applies preliminary action by performing inspection and repair of light-emitting elements before the transfer process. Specifically, the method inspects light-emitting elements on the first substrate before transferring them to the second substrate, and repairs any defective elements at this stage. This preliminary inspection and repair prevents transfer process failures and reduces defect rates while maintaining the flexibility benefits of the separate substrate transfer approach.
2Ease of repair
If redundant light-emitting elements are added for repair capability, then repair reliability is improved, but manufacturing cost increases
Solution Approach 1:
The patent applies self-service by enabling the light-emitting elements to be inspected and repaired in their original position on the first substrate before transfer. The inspection substrate is positioned to align with the light-emitting elements, allowing direct inspection and repair without needing redundant elements. This self-service approach at the source eliminates the need for backup elements, reducing manufacturing costs while maintaining repair reliability.
3Device complexity
If inspection and repair are performed after transfer, then process simplicity is improved, but repair efficiency decreases due to access difficulty
Solution Approach 1:
The patent performs inspection and repair as preliminary actions before the transfer process. The inspection substrate is positioned on the first substrate to align with light-emitting elements before transfer, allowing easy access for inspection and repair. This preliminary approach maintains process simplicity while significantly improving repair efficiency by accessing elements before they are transferred to the final substrate where access would be more difficult.
Data Source
AI summary
A method for repairing and inspecting a display device include transferring a light-emitting element onto the panel substrate; positioning the inspection substrate on the panel substrate such that the contact pins of the inspection substrate face the light-emitting element; connecting the contact pins to the light-emitting element and applying a voltage to the contact pins to identify whether or not the light-emitting element emits light and thus is defective or normal; upon determination that the light-emitting element is defective, replacing the defective light-emitting element with a normal light-emitting element; and connecting a wiring electrode to the normal light-emitting element.