Micro LED Testing by Electromagnetic Induction Without Probe Contact
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Solution Overview
Problem
The existing methods for testing micro light-emitting elements are laborious and time-consuming due to the small size and high density of these elements, which requires direct physical contact and poses a risk of damage during testing.
Innovation Solution
A method utilizing electromagnetic induction where a coil structure and a metal rod are used to induce a current in the light-emitting elements through the substrate, eliminating the need for direct contact and allowing for efficient testing of multiple elements without physical contact.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If probes are used to directly contact electrodes of micro light-emitting elements for testing, then testing can be performed, but the process becomes laborious and time-consuming due to the small size and high density of elements
Solution Approach 1:
The patent replaces the mechanical contact-based probing system with an electromagnetic induction-based wireless testing system. A coil structure generates a magnetic field that induces current in the light-emitting element through electromagnetic coupling, eliminating the need for physical probe contact. This substitution of mechanical measurement with electromagnetic measurement enables rapid, non-contact testing of micro light-emitting elements, significantly reducing testing time while maintaining accuracy.
2Reliability
If probes directly contact the electrodes of micro light-emitting elements, then electrical connection is established, but the risk of damaging the elements increases
Solution Approach 1:
The patent introduces an electromagnetic field as an intermediary between the testing equipment and the light-emitting element. The coil structure generates a magnetic field that serves as a mediator to transfer energy to the element without physical contact. This intermediary approach maintains reliable electrical connection for testing purposes while eliminating the mechanical stress and potential damage associated with direct probe contact.
3Ease of operation
If direct physical contact is made with micro light-emitting elements during testing, then electrode contact is achieved, but the complexity of the testing process increases
Solution Approach 1:
The patent replaces complex mechanical positioning and contact systems with a simplified electromagnetic induction system. Instead of requiring precise mechanical alignment of probes with tiny electrodes, the system uses a coil structure that generates a magnetic field capable of inducing current in the element wirelessly. This substitution dramatically simplifies the testing process, making it easier to operate while reducing the complexity of alignment and contact mechanisms.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method allows for rapid and non-invasive testing of micro light-emitting elements, reducing the risk of damage and enabling efficient evaluation of their optical characteristics, such as luminous flux and efficiency, without the need for direct electrode contact.
Implementation Method 1
a second coil winding the metal rod is provided, the second coil being electrically connected to an alternating current (AC) power supply. When testing the light-emitting element on the substrate, the two conductive plugs of the coil structure are inserted into one pair of through holes corresponding to one light-emitting element to electrically connect the first coil to the one light-emitting element. Upon activation of the AC power supply, and the metal rod being moved toward the coil structure, a current is induced in the first coil to test and drive the one light-emitting element to emit light.
Data Source
AI summary
A method for testing light-emitting elements includes: providing a substrate having light-emitting elements and conductive wires; providing at least one coil structure including a first coil and two conductive plugs connected to the first coil; providing a metal rod and a second coil winding the metal rod and connected to an AC power supply. Each light-emitting element includes a positive electrode and a negative electrode connected to one conductive wire, respectively. The substrate defines pairs of through holes, each pair of through holes is aligning with two conductive wires connected to the positive electrode and the negative electrode of one light-emitting element. The testing method further includes inserting the two conductive plugs into one pair of through holes, starting the AC power supply and moving the metal rod towards the coil structure to form an induced current in the first coil configured for driving the one light-emitting element.