Micro LED Display Redundant Subpixel Correction Circuit
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Solution Overview
Problem
Conventional displays with micro LEDs face challenges in correcting the effects of defective subpixels, particularly in distinguishing between 'short' and 'open' errors in LED units, which leads to reduced operating parameters and radiation characteristics, and existing methods are inefficient in intercepting these errors in pure parallel and series connections.
Innovation Solution
The display incorporates redundant subpixels with correction circuits that can switch light generation from primary to secondary emitters in case of defects, utilizing semiconductor materials and transistors to manage electrical connections and intercept errors like 'shorts' and 'opens', thereby enhancing production yield and reducing defect density.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If conventional displays use pure parallel or series connections for LED units, then the structure is simple, but the ability to detect and correct defective subpixels is reduced
Solution Approach 1:
The invention segments the LED unit into multiple subpixels (red, green, blue) with independent control capabilities. Each subpixel can be individually tested and corrected, allowing defective subpixels to be identified and replaced by activating alternative subpixels without affecting the entire display structure.
Solution Approach 2:
The invention implements preliminary testing and correction mechanisms during the manufacturing process. Defective subpixels are identified before final assembly, and correction circuits are pre-configured to switch between subpixels, ensuring reliability is addressed before the display enters service.
2Reliability
If redundant subpixels and correction circuits are added to each emitter unit, then defect correction capability is improved, but device complexity increases
Solution Approach 1:
The invention makes subpixels universal by designing them to perform multiple functions: normal light emission and backup replacement for defective subpixels. Each subpixel can serve as either a primary emitter or a corrective replacement, reducing the need for dedicated redundant components and simplifying the overall structure.
Solution Approach 2:
The correction circuit is designed to automatically detect and correct defective subpixels without external intervention. The system self-tests subpixels during manufacturing and self-corrects by switching to alternative subpixels when defects are detected, eliminating the need for complex external repair mechanisms.
3Productivity
If all subpixels are tested and correction circuits are actuated during manufacturing, then production yield is improved, but manufacturing time increases
Solution Approach 1:
The invention performs subpixel testing and correction circuit actuation during the manufacturing process itself, rather than as a separate post-manufacturing step. This preliminary action ensures that displays are corrected before leaving the production line, improving yield without adding separate time-consuming repair stages.
Solution Approach 2:
The testing and correction process is integrated into the continuous manufacturing flow. Subpixels are tested and corrected circuits are actuated as part of the assembly process, maintaining continuous production rather than interrupting the manufacturing line for separate testing and repair operations.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution effectively corrects emission characteristics, increases production yield, and allows for efficient repair of defective pixels by intercepting 'shorts' and 'opens' in pixels, ensuring consistent light emission and improved display performance.
Implementation Method 1
The primary emitters and the secondary emitters assigned to each other are based on the same semiconductor material. For this purpose, the primary emitters and the secondary emitters preferably each comprise a semiconductor layer sequence.
Implementation Method 2
The correction circuit is configured to be able to switch the generation of light from the primary emitter to the associated secondary emitter in case of a defect of the primary emitter. This switching can be done automatically or by modifying or adapting the correction circuit, for example by interrupting or adding electrical connections and/or by switching through or blocking switching units such as transistors, in particular field-effect transistors.
Data Source
AI summary
A display includes a plurality of pixels. The pixels include at least one emitter unit. The emitter units each include a primary emitter and a secondary emitter for generating light of the same color. The secondary emitter is associated with the primary emitter of the corresponding emitter unit. The primary emitters and the secondary emitters are based on at least one semiconductor material. The emitter units each include a correction circuit. The correction circuits are each configured to be able to switch the generation of light from the primary emitter to the associated secondary emitter in case of a defect of the associated primary emitter.


