Micro LED Display Panels With Test Transistors for Anode Defect Detection

The patent incorporates test transistors and test electrodes into the pixel circuit structure before the actual product functionality is implemented. These test components are built in advance during the same manufacturing process, allowing defect detection to be performed prior to final assembly and application, thereby enabling early identification of defects in anode pads and connection wirings without requiring additional post-manufacturing inspection equipment.

The patent introduces test transistors as intermediary components that mediate between the pixel circuits and external detection equipment. These test transistors serve as access points that allow external devices to apply test voltages and measure current flow through the pixel electrodes and connection wirings, thereby enabling indirect detection of defects that would otherwise be inaccessible to direct measurement methods.

The patent merges the test transistor structure with the existing pixel circuit architecture by integrating test transistors alongside the drive transistors and utilizing shared components such as pixel electrodes and metal interconnect layers. This consolidation allows defect detection functionality to be added without requiring entirely separate test circuitry, thereby limiting the increase in structural complexity while still achieving reliable defect detection capability.

The test transistors are designed to serve multiple functions: they can detect defects in pixel electrodes, verify connection wiring integrity, and potentially characterize electrical properties of the pixel circuit components. This multi-functionality reduces the need for separate specialized test structures for each detection purpose, thereby achieving comprehensive defect detection capability without proportionally increasing device complexity.